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Pregled bibliografske jedinice broj: 1016303

Surface morphology evolution during electric field assisted dissolution of thin metal films


Okorn, Boris; Fabijanić, Ivana; Sancho- Parramon, Jordi; Zupanič, Franc; Bončina, Tonica; Janicki, Vesna
Surface morphology evolution during electric field assisted dissolution of thin metal films // Thin solid films, 685 (2019), 402-407 doi:10.1016/j.tsf.2019.06.037 (međunarodna recenzija, članak, znanstveni)


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Naslov
Surface morphology evolution during electric field assisted dissolution of thin metal films

Autori
Okorn, Boris ; Fabijanić, Ivana ; Sancho- Parramon, Jordi ; Zupanič, Franc ; Bončina, Tonica ; Janicki, Vesna

Izvornik
Thin solid films (0040-6090) 685 (2019); 402-407

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Thin metal films ; Electric field assisted dissolution ; Spectroscopic ellipsometry ; Glass poling

Sažetak
Electric field assisted dissolution is a process that enables micro- and nano- structuring of metal nanocomposite glasses, metal island films and compact metal layers on glass substrates, using simple equipment and technical setup. During the process, metal ions drift into a glass matrix under the influence of moderately elevated temperature and the applied electric field. The surface quality of nanostructured metal layers has great importance in many applications as it influences the device performance. In this work, a study of the surface morphology evolution during the dissolution of a compact metal layer is presented. It is found that in the course of gradual change from a compact to a completely dissolved layer, drift of metal ions from glass/layer interface is followed by the simultaneous deterioration of the surface quality already from the very beginning of the process. The surface morphology evolution could be described by the occurrence of surface roughness of the metal layer and continuous thinning of the layer. Understanding how this process takes place is important for improvement of electric field assisted dissolution application in structuring metal layers for optoelectronic devices.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
PoC6_11_45 U-1
HRZZ-IP-2016-06-2168 - Razlaganje električnim poljem u tankim optičkim slojevima - nanostrukturiranje, dopiranje, porozni slojevi (REPTOSNANODOPS) (Janicki, Vesna, HRZZ - 2016-06) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Poveznice na cjeloviti tekst rada:

doi doi.org www.sciencedirect.com

Citiraj ovu publikaciju:

Okorn, Boris; Fabijanić, Ivana; Sancho- Parramon, Jordi; Zupanič, Franc; Bončina, Tonica; Janicki, Vesna
Surface morphology evolution during electric field assisted dissolution of thin metal films // Thin solid films, 685 (2019), 402-407 doi:10.1016/j.tsf.2019.06.037 (međunarodna recenzija, članak, znanstveni)
Okorn, B., Fabijanić, I., Sancho- Parramon, J., Zupanič, F., Bončina, T. & Janicki, V. (2019) Surface morphology evolution during electric field assisted dissolution of thin metal films. Thin solid films, 685, 402-407 doi:10.1016/j.tsf.2019.06.037.
@article{article, author = {Okorn, Boris and Fabijani\'{c}, Ivana and Sancho- Parramon, Jordi and Zupani\v{c}, Franc and Bon\v{c}ina, Tonica and Janicki, Vesna}, year = {2019}, pages = {402-407}, DOI = {10.1016/j.tsf.2019.06.037}, keywords = {Thin metal films, Electric field assisted dissolution, Spectroscopic ellipsometry, Glass poling}, journal = {Thin solid films}, doi = {10.1016/j.tsf.2019.06.037}, volume = {685}, issn = {0040-6090}, title = {Surface morphology evolution during electric field assisted dissolution of thin metal films}, keyword = {Thin metal films, Electric field assisted dissolution, Spectroscopic ellipsometry, Glass poling} }
@article{article, author = {Okorn, Boris and Fabijani\'{c}, Ivana and Sancho- Parramon, Jordi and Zupani\v{c}, Franc and Bon\v{c}ina, Tonica and Janicki, Vesna}, year = {2019}, pages = {402-407}, DOI = {10.1016/j.tsf.2019.06.037}, keywords = {Thin metal films, Electric field assisted dissolution, Spectroscopic ellipsometry, Glass poling}, journal = {Thin solid films}, doi = {10.1016/j.tsf.2019.06.037}, volume = {685}, issn = {0040-6090}, title = {Surface morphology evolution during electric field assisted dissolution of thin metal films}, keyword = {Thin metal films, Electric field assisted dissolution, Spectroscopic ellipsometry, Glass poling} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





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