Pregled bibliografske jedinice broj: 1007153
Layer dependence of third-harmonic generation in thick multilayer graphene
Layer dependence of third-harmonic generation in thick multilayer graphene // Physical Review Materials, 2 (2018), 7; 071002(R), 5 doi:10.1103/physrevmaterials.2.071002 (međunarodna recenzija, članak, znanstveni)
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Naslov
Layer dependence of third-harmonic generation in thick multilayer graphene
Autori
Yang, Hao ; Guan, Honghua ; Biekert, Nicolas ; Arefe, Ghidewon ; Chang, Damien C. ; Sun, Yawen ; Yeh, Po-Chun ; Liu, Xiaoping ; Hong, Sung-Young ; Delač Marion, Ida ; Kralj, Marko ; Hone, James C. ; Osgood, Richard M. ; Dadap, Jerry I.
Izvornik
Physical Review Materials (2475-9953) 2
(2018), 7;
071002(R), 5
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
multilayer graphene, nonlinear optical processes
Sažetak
We demonstrate experimental evidence for the existence of an optimal thickness that yields the maximum third-harmonic (TH) signal in thick multilayer graphene (MLG). We measure the layer-dependent TH signal from MLG on a quartz substrate for N graphene layers ranging from ∼3 to 50. Theoretical predictions of the layer-dependent TH signal are compared with experiment, including those measured using atomic force and optical microscopy. We find the optimal TH signal for N≈24, in good agreement with two theoretical models: one in which the graphene layers are assumed isolated but contribute coherently, and one in which the MLG is assumed as one continuous thin film. Our measurements reveal that for MLG, the stacking property of the linear and nonlinear conductivities are found to be remarkably preserved up to the very thick layers (N∼50), i.e., σ(i)N, g=Nσ(i)g, where i=1 and 3, respectively, and σ(i)g is the corresponding monolayer conductivity.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI