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Dubček, Pavo ; Pivac, Branko ; Bernstorff, Sigrid ; Corni, F. ; Tonini, R. ; Ottaviani, G.
X-ray reflectivity study of hydrogen implanted silicon // Applied surface science, 253 (2006), 283-286-x
Mikšić, Vesna ; Pivac, Branko ; Rakvin, Boris ; Zorc, Hrvoje ; Corni, F. ; Tonini, R. ; Ottaviani, G.
DLTS and EPR study of defects in H implanted silicon // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 186 (2002), 1/4; 36-40. doi: 10.1016/S0168-583X(01)00919-3
Pivac, Branko ; Rakvin, Boris ; Tonini, R ; Corni, F ; Ottaviani, G
Reply to comments on 'EPR study of He-implanted Si' by P. Pivac, B. Rakvin, R. Tonini, F. Corni, G. Ottaizani, Published in Mater. Sci. Eng. B73 (2000) 60-63 - Written by M. Kakazey, M. Vlasova, and J.G. Gonzalez-Rodriguez - Reply to discussio // Materials science & engineering. B, Solid-state materials for advanced technology, 90 (2002), 1-2; 211-212-x
Dubček, Pavo ; Pivac, Branko ; Bernstorff, Sigrid ; Tonini, R. ; Corni, F. ; Ottaviani, G.
Grazing incidence small angle x-ray scattering study of irradiation induced defects in monocrystalline silicon // Austrian SAXS Beamline at Elettra, Anual Report 2001. 2002.
Rakvin, Boris ; Pivac, Branko ; Tonini, R. ; Corni, F. ; Ottaviani, G.
Electron paramagnetic evidence for reversible transformation of thermal donor into shallow donor-type center in hydrogen-implanted silicon // Applied physics letters, 73 (1998), 3250-3252-x
