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Živković, Zlatko ; Šarolić, Antonio ; Roje, Vesna
Effects of Effective Dielectric Constant of Printed Short Dipoles in Electric Field Probes // Proceedings of EMC Europe 2011 York. 2011. str. 73-78
Senić, Damir ; Šarolić, Antonio ; Roje, Vesna
GTEM Cell Setup and Method for Measuring Shielding Effectiveness of Resonant Enclosures // Proceedings of EMC Europe 2011 York. 2011. str. 192-197
Roje, Vesna
Report on IEEE EMCS Croatia Chapter Activity in 2009/10, 2010 Chaptert Retreat // IEEE EMC 2010 Symposium, Fort Lauderdale. 2010.
Živković, Zlatko ; Šarolić, Antonio ; Roje, Vesna
Gain, Antenna Factor and RCS Measurements in GTEM Cell // IEEE EMC 2010 Symposium
Fort Lauderdale (FL), Sjedinjene Američke Države, 25.07.2010-30.07.2010
Poljak, Dragan ; Dorić, Vicko ; Roje, Vesna
Modeling of Complex Wire Structures for EMC Applications // IEEE EMCS 2010 Symposium
Fort Lauderdale (FL), Sjedinjene Američke Države, 25.07.2010-30.07.2010
Poljak, Dragan ; Ćerdić, Darko ; Dorić, Vicko ; Peratta, Andres ; Roje, Vesna ; Brebbia, Carlos
Boundary element modeling of complex grounding systems: study on current distribution // Boundary Elements and other Mesh Reduction Methods XXXII / C.A. Brebbia (ur.). Southampton: Wessex Institute of Technology Press, 2010. str. 123-132
Dorić, Vicko ; Poljak, Dragan ; Roje, Vesna
Direct time domain analysis of a lightning rod based on the antenna theory // 8-th International Symposium on Electromagnetic Compatibility and Electromagnetic Biology - The Proceedings. Sankt Peterburg, 2009. str. 215-218
Dorić, Vicko ; Poljak, Dragan ; Roje, Vesna
Direct Time Domain Analysis of a Grounding Electrode Based on the Antenna Theory // Book of Abstracts / Rachidi, Farhad (ur.). Lausanne: École polytechnique fédérale de Lausanne (EPFL), 2008. str. 187-187
Christopulos, C. ; Zhang, Y. ; Paul, J. ; Garbe, H. ; Batterman, S. ; Skrzypczynski, J. ; Kucharski, A.A. ; Roje, Vesna ; Antonijević, Siniša ; Dorić, Vicko et al.
Near-field coupling of wireless devices and long communications cables // Iet science measurement & technology, 2 (2008), 1; 18-24-x