Pregled po CROSBI profilu: Ivana Capan (CROSBI Profil: 17649, MBZ: 239373)
Pronađeno 131 radova
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1.Capan, Ivana; Brodar, Tomislav; Bernat, Robert; ...Coutinho, Jose;M-center in 4H-SiC: Isothermal DLTS and first principles modeling studies // Journal of applied physics, 130 (2021), 12; 125703, 10 doi:10.1063/5.0064958 (međunarodna recenzija, članak, znanstveni)
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2.Bernat, Robert; Bakrač, Luka; Radulović, Vladimir; Snoj, Luka; Makino, Takahiro; Ohshima, Takeshi; Pastuović, Željko; Capan, Ivana4H-SiC Schottky Barrier Diodes for Efficient Thermal Neutron Detection // Materials, 14 (2021), 17; 5105-5115 doi:10.3390/ma14175105 (međunarodna recenzija, članak, znanstveni)
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3.Čižmar, Tihana; Panžić, Ivana; Capan, Ivana; Gajović, AndrejaNanostructured TiO2 photocatalyst modified with Cu for improved imidacloprid degradation // Applied surface science, 569 (2021), 151026, 10 doi:10.1016/j.apsusc.2021.151026 (međunarodna recenzija, članak, znanstveni)
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4.Kojić, Vedran; Bohač, Mario; Bafti, Arijeta; Pavić, Luka; Salamon, Krešimir; Čižmar, Tihana; Gracin, Davor; Juraić, Krunoslav; Leskovac, Mirela; Capan, Ivana; Gajović, AndrejaFormamidinium Lead Iodide Perovskite Films with Polyvinylpyrrolidone Additive for Active Layer in Perovskite Solar Cells, Enhanced Stability and Electrical Conductivity // Materials, 14 (2021), 16; 4594, 18 doi:10.3390/ma14164594 (međunarodna recenzija, članak, znanstveni)
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5.Coutinho, J; Gouveia, J.D.; Makino, T.; Ohshima, T.; Pastuović, Željko; Bakrač, Luka; Brodar, Tomislav; Capan, IvanaM center in 4H-SiC is a carbon self-interstitial // Physical review. B., 103 (2021), 180102, 4 doi:10.1103/PhysRevB.103.L180102 (međunarodna recenzija, pismo, znanstveni)
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6.Bernat, RobertRAZVOJ KONVERTERA ZA UČINKOVITU DETEKCIJU TERMALNIH NEUTRONA, 2021., doktorska disertacija, Fakultet kemijskog inženjerstva i tehnologije, Zagreb
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7.Bernat, Robert; Capan, Ivana; Bakrač, Luka; Brodar, Tomislav; Makino, Takahiro; Ohshima, Takeshi; Pastuović, Željko; Sarbutt, AdamResponse of 4H-SiC Detectors to Ionizing Particles // Crystals, 11 (2021), 1; 10, 13 doi:10.3390/cryst11010010 (međunarodna recenzija, članak, znanstveni)
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8.Radulović, Vladimir; Ambrožič, Klemen; Snoj, Luka; Capan, Ivana; Brodar, Tomislav; Ereš, Zoran; Pastuović, Željko; Sarbutt, Adam; Ohshima, Takeshi; Yamazaki, Yuichi; Coutinho, JoséE-SiCure Collaboration Project: Silicon Carbide Material Studies and Detector Prototype Testing at the JSI TRIGA Reactor // ANIMMA 2019 – Advancements in Nuclear Instrumentation Measurement Methods and their Applications / Lyoussi, A. ; Giot, M. ; Carette, M. ; Jenčič, I. ; Reynard-Carette, C. ; Vermeeren, L. ; Snoj, L. ; Le Dû, P. (ur.).
Portorož, Slovenija: EDP Sciences, 2020. 07007, 6 doi:10.1051/epjconf/202022507007 (radionica, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
9.Capan, Ivana; Brodar, Tomislav; Yamazaki, Yuichi; Oki, Yuya; Ohshima, Takeshi; Chiba, Yoji; Hijikata, Yasuto; Snoj, Luka; Radulović, VladimirInfluence of neutron radiation on majority and minority carrier traps in n-type 4H-SiC // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 478 (2020), 224-228 doi:10.1016/j.nimb.2020.07.005 (međunarodna recenzija, članak, znanstveni)
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10.Brodar, Tomislav; Bakrač, Luka; Capan, Ivana; Ohshima, Takeshi; Snoj, Luka; Radulović, Vladimir; Pastuović, ŽeljkoDepth Profile Analysis of Deep Level Defects in 4H- SiC Introduced by Radiation // Crystals, 10 (2020), 9; 845, 16 doi:10.3390/cryst10090845 (međunarodna recenzija, članak, znanstveni)
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11.Coutinho, José; Torres, Vitor J. B.; Capan, Ivana; Brodar, Tomislav; Ereš, Zoran; Bernat, Robert; Radulovič, Vladimir; Ambrožič, Klemen; Snoj, Luka; Pastuović, Željko et al.Silicon carbide diodes for neutron detection // Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 986 (2020), 164793, 55 doi:10.1016/j.nima.2020.164793 (međunarodna recenzija, pregledni rad, znanstveni)
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12.Kovačić, Marin; Perović, Klara; Papac, Josipa; Tomić, Antonija; Matoh, Lev; Žener, Boštjan; Brodar, Tomislav; Capan, Ivana; Surca, Angelja K.; Kušić, Hrvoje et al.One-Pot Synthesis of Sulfur-Doped TiO2/Reduced Graphene Oxide Composite (S-TiO2/rGO) with Improved Photocatalytic Activity for the Removal of Diclofenac from Water // Materials, 13 (2020), 7; 1621, 14 doi:10.3390/ma13071621 (međunarodna recenzija, članak, znanstveni)
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13.Radulović, Vladimir; Yamazaki, Yuichi; Pastuović, Željko; Sarbutt, Adam; Ambrožič, Klemen; Bernat, Robert; Ereš, Zoran; Coutinho, José; Ohshima, Takeshi; Capan, Ivana; Snoj, LukaSilicon carbide neutron detector testing at the JSI TRIGA reactor for enhanced border and port security // Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 972 (2020), 154122, 8 doi:10.1016/j.nima.2020.164122 (međunarodna recenzija, članak, znanstveni)
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14.Capan, Ivana; Yamazaki, Yuichi; Oki, Yuya; Brodar, Tomislav; Makino, Takahiro; Ohshima, TakeshiMinority Carrier Trap in n-Type 4H–SiC Schottky Barrier Diodes // Crystals, 9 (2019), 7; 328, 7 doi:10.3390/cryst9070328 (međunarodna recenzija, članak, znanstveni)
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15.Capan, Ivana; Brodar, Tomislav; Ohshima, Takeshi; Sato, Shinichiro; Makino, Takahiro; Pastuovic, Željko; Siegele, Rainer; Snoj, Luka; Radulović, Vadimir; Coutinho, José et al.Deep Level Defects in 4H-SiC Epitaxial Layers // ICSCRM 2017 - The 2017 International Conference on Silicon Carbide and Related Materials
Washington, D.C., SAD: Trans Tech Publications, Ltd., 2018. str. 225-228 doi:10.4028/www.scientific.net/msf.924.225 (ostalo, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
16.Radulović, Vladimir; Ambrožič, Klemen; Snoj, Luka; Capan, Ivana; Brodar, Tomislav; Ereš, Zoran; Pastuović, Željko; Sarbutt, Adam; Ohshima, Takeshi; Yamazaki, Yuichi; Coutinho, JoséE-SiCure Collaboration Project: Silicon Carbide Material Studies and Detector Prototype Testing at the JSI TRIGA Reactor // NENE 2018 - The 27th International Conference Nuclear Energy for New Europe
Portorož, Slovenija, 2018. 702, 1 (radionica, podatak o recenziji nije dostupan, sažetak, znanstveni) -
17.Capan, Ivana; Brodar, Tomislav; Coutinhi, Jose; Ohshima, Takeshi; Markevich, Vladimir; Peaker, AnthonyAcceptor levels of the carbon vacancy in 4H-SiC: Combining Laplace deep level transient spectroscopy with density functional modeling // Journal of applied physics, 124 (2018), 24; 245701, 10 doi:10.1063/1.5063773 (međunarodna recenzija, članak, znanstveni)
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18.Brodar, Tomislav; Capan, Ivana; Radulovic, Vladimir; Snoj, Luka; Pastuović, Željko; Coutinho, Jose; Ohshima, TakeshiLaplace DLTS study of deep defects created in neutron-irradiated n-type 4H-SiC // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 437 (2018), 1; 27-31 doi:10.1016/j.nimb.2018.10.030 (međunarodna recenzija, članak, znanstveni)
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19.Knežević, Tihomir; Nanver, Lis K.; Capan, Ivana; Suligoj, TomislavNon-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures // Proceedings of the 41st International Convention MIPRO 2018 / Biljanovic, Petar (ur.).
Rijeka: IEEE, 2018. str. 12-17 doi:10.23919/mipro.2018.8399822 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
20.Mozetič, M.; Vesel, A.; Primc, G.; Eisenmenger-Sittner, C.; Bauer, J.; Eder, A.; Schmid, G.H.S.; Ruzic, D.N.; Ahmed, Z.; Barker, D. et al.Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology // Thin solid films, 660 (2018), 120-160 doi:10.1016/j.tsf.2018.05.046 (međunarodna recenzija, članak, znanstveni)
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21.Capan, Ivana; Brodar, Tomislav; Pastuović, željko; Ohshima, Takeshi; Snoj, Luka; Radulović, Vladimir; Coutinho, Jose; Demouche, KamelDouble negatively charged carbon vacancy at the h- and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study // Journal of applied physics, 123 (2018), 16; 161597, 37 doi:10.1063/1.5011124 (međunarodna recenzija, članak, znanstveni)
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22.Krstulović, Nikša; Salamon, Krešimir; Budimlija, Ognjen; Kovač, Janez; Dasović, Jasna; Umek, Polona; Capan, IvanaParameters optimization for synthesis of Al- doped ZnO nanoparticles by laser ablation in water // Applied surface science, 440 (2018), 916-925 doi:10.1016/j.apsusc.2018.01.295 (međunarodna recenzija, članak, znanstveni)
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23.Brodar, TomislavElektrički aktivni defekti u 4H-SiC uvedeni zračenjem, 2017., diplomski rad, diplomski, Prirodoslovno matematički fakultet, Zagreb
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24.Pastuović, Željko; Siegele, Rainer; Capan, Ivana; Brodar, Tomislav; Sato, Shin-icihiro; Ohshima, TakeshiDeep level defects in 4H-SiC introduced by ion implantation: the role of single ion regime // Journal of physics. Condensed matter, 29 (2017), 47; 475701, 6 doi:10.1088/1361-648X/aa908c (međunarodna recenzija, članak, znanstveni)
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25.Krstulović, Nikša; Umek, Polona; Salamon, Krešimir; Capan, IvanaSynthesis of Al-doped ZnO nanoparticles by laser ablation of ZnO:Al2O3 target in water // Materials Research Express, 4 (2017), 105003, 5 doi:10.1088/2053-1591/aa896d (međunarodna recenzija, članak, znanstveni)
