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Pregled bibliografske jedinice broj: 990068

Measurement Uncertainty Propagation through Basic Photovoltaic Cell Models


Tolić, Ivan; Primorac, Mario; Miličević, Kruno
Measurement Uncertainty Propagation through Basic Photovoltaic Cell Models // Energies, 12 (2019), 6; 1029, 16 doi:10.3390/en12061029 (međunarodna recenzija, članak, znanstveni)


Naslov
Measurement Uncertainty Propagation through Basic Photovoltaic Cell Models

Autori
Tolić, Ivan ; Primorac, Mario ; Miličević, Kruno

Izvornik
Energies (1996-1073) 12 (2019), 6; 1029, 16

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Measurement uncertainty ; Monte Carlo simulations ; fill factor ; photovoltaic cell model

Sažetak
This paper presents measurement uncertainty propagation through four basic photovoltaic cell models: One-diode model without resistances, with one resistance and with two resistances and two- diode model with two resistances. The expressions for the output current of all photovoltaic cell models is presented as a function of global irradiance G and temperature T. Next, the expressions for all fill factor parameters: short-circuit current, open-circuit voltage, current and voltage at the maximum power point, depending on the global irradiance G and temperature T are derived as well. For each parameter, Monte Carlo simulations to calculate the measurement uncertainty of the parameter are performed and the results were used as input values for the calculation of measurement uncertainty of fill factor. Practical calculations are performed in laboratory for renewable energy sources located on 45°32′ N and 18°44′ E. Final fill factor calculations are compared for three different module technologies.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Ustanove
Fakultet elektrotehnike, računarstva i informacijskih tehnologija Osijek

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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