Infrared spectroscopy of ion tracks in amorphous SiO2 and comparison to gamma irradiation induced changes (CROSBI ID 260015)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Karlušić, Marko ; Škrabić, Marko ; Majer, Marija ; Buljan, Maja ; Skuratov, Vladimir A ; Jung, Hyun- Kyu ; Gamulin, Ozren ; Jakšić, Milko
engleski
Infrared spectroscopy of ion tracks in amorphous SiO2 and comparison to gamma irradiation induced changes
Ion track formation in amorphous SiO2 was investigated using infrared spectroscopy. For comparison, one set of samples was also irradiated using 1.25 MeV gamma rays. An increase of 1044 cm−1 peak and decrease of 1078 cm−1 peak was observed in all cases. Experimental results were analysed using an analytical thermal spike model and non-standard model parameters were found. This finding is attributed to the amorphous structure of the material.
Swift heavy ionIon track ; Thermal spike ; Amorphous SiO2 ; Infrared spectroscopy ; Gamma rays
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Podaci o izdanju
514
2019.
74-83
objavljeno
0022-3115
1873-4820
10.1016/j.jnucmat.2018.11.010
