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Pregled bibliografske jedinice broj: 951966

Atomic-scale defects and electronic properties of a transferred synthesized MoS2 monolayer


Delač Marion, Ida; Čapeta, Davor; Pielić, Borna; Faraguna, Fabio; Gallardo, Aurelio; Pou, Pablo; Biel, Blanca; Vujičić, Nataša; Kralj, Marko
Atomic-scale defects and electronic properties of a transferred synthesized MoS2 monolayer // Nanotechnology, 29 (2018), 30; 1-12 doi:10.1088/1361-6528/aac27d (međunarodna recenzija, članak, znanstveni)


Naslov
Atomic-scale defects and electronic properties of a transferred synthesized MoS2 monolayer

Autori
Delač Marion, Ida ; Čapeta, Davor ; Pielić, Borna ; Faraguna, Fabio ; Gallardo, Aurelio ; Pou, Pablo ; Biel, Blanca ; Vujičić, Nataša ; Kralj, Marko

Izvornik
Nanotechnology (0957-4484) 29 (2018), 30; 1-12

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
MoS 2 monolayer, Ir(111), atomic defects, scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS), density functional theory (DFT), photoluminescence (PL)

Sažetak
MoS2 monolayer samples were synthesized on a SiO2/Si wafer and transferred to Ir(111) for nano-scale characterization. The samples were extensively characterized during every step of the transfer process, and MoS2 on the final substrate was examined down to the atomic level by scanning tunneling microscopy (STM). The procedures conducted yielded high-quality monolayer MoS2 of milimeter-scale size with an average defect density of 2 × 1013 cm–2. The lift-off from the growth substrate was followed by a release of the tensile strain, visible in a widening of the optical band gap measured by photoluminescence. Subsequent transfer to the Ir(111) surface led to a strong drop of this optical signal but without further shifts of characteristic peaks. The electronic band gap was measured by scanning tunneling spectroscopy (STS), revealing n-doping and lateral nano-scale variations. The combined use of STM imaging and density functional theory (DFT) calculations allows us to identify the most recurring point-like defects as S vacancies.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Ustanove
Institut za fiziku, Zagreb,
Fakultet kemijskog inženjerstva i tehnologije, Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
  • Scopus
  • MEDLINE


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