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Pregled bibliografske jedinice broj: 946358

Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering


Siketić, Zdravko; Bogdanović Radović, Ivančica; Sudić, Ivan; Jakšić, Milko
Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering // Scientific Reports, 8 (2018), 10392, 6 doi:10.1038/s41598-018-28726-x (međunarodna recenzija, članak, znanstveni)


Naslov
Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering

Autori
Siketić, Zdravko ; Bogdanović Radović, Ivančica ; Sudić, Ivan ; Jakšić, Milko

Izvornik
Scientific Reports (2045-2322) 8 (2018); 10392, 6

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
TOF-ERDA ; Depth profiling, Ar sputtering

Sažetak
The recent development of new advanced materials demands extensive effort in developing new analytical techniques that can provide insight into material composition at the nanoscale, particularly at surfaces and interfaces, which is important for both fabrication and material performance. Here, we present a proof of principle for a new setup used for thin-film characterisation and depth profiling based on a combination of time-of-flight elastic recoil detection analysis (TOF-ERDA) and Ar sputtering. A quantitative depth profiling with a best achievable surface depth resolution of ~2 nm can be realised for the entire layer, which is important for the precise determination of thickness and composition of samples that are several tenths of a nanometre thick. The performance of TOF-ERDA with Ar sputtering was demonstrated using 15 nm Cu evaporated onto a Si substrate. The advantages and limits of the method are discussed in detail.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus
  • MEDLINE


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