Electrical characterization of a graphite-diamond-graphite junction fabricated by MeV carbon implantation (CROSBI ID 251915)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Ditalia Tchernij, S. ; Skukan, Natko ; Picollo, F. ; Battiato, A. ; Grilj, Veljko ; Amato, G. ; Boarino, L. ; Enrico, E. ; Jakšić, Milko ; Olivero, P. ; Forneris, J.
engleski
Electrical characterization of a graphite-diamond-graphite junction fabricated by MeV carbon implantation
The Deep Ion Beam Lithography technique has been extensively adopted in recent years for the fabrication of graphitic electrodes in bulk diamond with a wide range of technological applications. Particularly, it has been recently shown that a high current can be driven in devices consisting of micrometer-spaced sub-superficial graphitic electrodes. This effect has been exploited to stimulate electroluminescence from color centers placed in the active region of the device.
Diamond ; Graphite ; Implantation ; Radiation induced effects ; Electrical properties characterization
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Podaci o izdanju
74
2017.
125-131
objavljeno
0925-9635
1879-0062
10.1016/j.diamond.2017.02.019