Signal-to-noise ratio of arbitrarily filtered spontaneous emission (CROSBI ID 662301)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Šprem, Marko ; Bosiljevac, Marko ; Babic, Dubravko I.
engleski
Signal-to-noise ratio of arbitrarily filtered spontaneous emission
The signal-to-noise ratio (SNR) of filtered incoherent light can be approximated from the product of the coherence time of the light and the equivalent (electrical) noise bandwidth of the detector. This approximation holds only for the light with very short coherence time, that is in the case where the optical bandwidth of the light is much larger than the electrical bandwidth. We present here an expression for accurate evaluation of the SNR of the filtered incoherent light, which computes SNR from arbitrary shapes of optical and electrical filter power spectral densities (PSD). The PSDs of the filters can be measured using optical and electrical spectrum analyzers. Using our expression, we show that the SNR reaches unity when the electrical filter bandwidth is becoming larger than the optical filter bandwidth. To prove the theory, we evaluate and directly measure SNR of an incoherent light source filtered with several optical filters with bandwidths larger and commensurate with the bandwidth of the detector. For later we used optical and electrical filters with 3-dB bandwidths of 15 GHz and 10 GHz, respectively. Using our expression to evaluate SNR we obtained results in a good agreement with directly measured SNR. The results also prove that the approximation for evaluating SNR does not provide accurate results. The PSD of the detector with large noise bandwidth is difficult to measure using spectrum analyzer. There- fore, we report here a method for measuring the electrical noise bandwidth of the detector using the heterodyne linewidth measurement technique with tunable laser.
spectrum-sliced spontaneous emission, signal to noise ratio, electrical filter power spectral density
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o prilogu
1052621
2018.
objavljeno
10.1117/12.2289090
Podaci o matičnoj publikaciji
Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI
SPIE
Podaci o skupu
SPIE Photonics West 2018
poster
27.01.2018-01.02.2018
San Francisco (CA), Sjedinjene Američke Države