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Pregled bibliografske jedinice broj: 939391

Imaging of Optically Active Defects with Nanometer Resolution


Feng, Jiandong; Deschout, Hendrik; Caneva, Sabina; Hofmann, Stephan; Lončarić, Ivor; Lazić, Predrag; Radenovic, Aleksandra
Imaging of Optically Active Defects with Nanometer Resolution // Nano Letters, 18 (2018), 3; 1739-1744 doi:10.1021/acs.nanolett.7b04819 (međunarodna recenzija, članak, znanstveni)


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Naslov
Imaging of Optically Active Defects with Nanometer Resolution

Autori
Feng, Jiandong ; Deschout, Hendrik ; Caneva, Sabina ; Hofmann, Stephan ; Lončarić, Ivor ; Lazić, Predrag ; Radenovic, Aleksandra

Izvornik
Nano Letters (1530-6984) 18 (2018), 3; 1739-1744

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Super resolution microscopy, boron nitride monolayer, point defects, localization microscopy

Sažetak
Point defects significantly influence the optical and electrical properties of solid-state materials due to their interactions with charge carriers, which reduce the band-to-band optical transition energy. There has been a demand for developing direct optical imaging methods that would allow in situ characterization of individual defects with nanometer resolution. Here, we demonstrate the localization and quantitative counting of individual optically active defects in monolayer hexagonal boron nitride using single molecule localization microscopy. By exploiting the blinking behavior of defect emitters to temporally isolate multiple emitters within one diffraction limited region, we could resolve two defect emitters with a point-to-point distance down to ten nanometers. The results and conclusion presented in this work add unprecedented dimensions toward future applications of defects in quantum information processing and biological imaging.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
EK-H2020-692194 - Ruđer Bošković Institute: Twinning for a step forward of the Theoretical Physics Division (RBI-T-WINNING) (NESTI, Fabrizio, EK - H2020-TWINN-2015)

Ustanove
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Predrag Lazić (autor)

Avatar Url Ivor Lončarić (autor)

Citiraj ovu publikaciju

Feng, Jiandong; Deschout, Hendrik; Caneva, Sabina; Hofmann, Stephan; Lončarić, Ivor; Lazić, Predrag; Radenovic, Aleksandra
Imaging of Optically Active Defects with Nanometer Resolution // Nano Letters, 18 (2018), 3; 1739-1744 doi:10.1021/acs.nanolett.7b04819 (međunarodna recenzija, članak, znanstveni)
Feng, J., Deschout, H., Caneva, S., Hofmann, S., Lončarić, I., Lazić, P. & Radenovic, A. (2018) Imaging of Optically Active Defects with Nanometer Resolution. Nano Letters, 18 (3), 1739-1744 doi:10.1021/acs.nanolett.7b04819.
@article{article, year = {2018}, pages = {1739-1744}, DOI = {10.1021/acs.nanolett.7b04819}, keywords = {Super resolution microscopy, boron nitride monolayer, point defects, localization microscopy}, journal = {Nano Letters}, doi = {10.1021/acs.nanolett.7b04819}, volume = {18}, number = {3}, issn = {1530-6984}, title = {Imaging of Optically Active Defects with Nanometer Resolution}, keyword = {Super resolution microscopy, boron nitride monolayer, point defects, localization microscopy} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
  • Scopus
  • MEDLINE


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