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Pregled bibliografske jedinice broj: 901001

How to determine microstructure from the overlapping XRD profiles - the new model


Dekanić, Krešimir; Lončarić, Sven; Skoko, Željko
How to determine microstructure from the overlapping XRD profiles - the new model // First Int'l Workshop on Data Science (IWDS 2016)
Zagreb, Hrvatska, 2016. (poster, nije recenziran, sažetak, znanstveni)


Naslov
How to determine microstructure from the overlapping XRD profiles - the new model

Autori
Dekanić, Krešimir ; Lončarić, Sven ; Skoko, Željko

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Skup
First Int'l Workshop on Data Science (IWDS 2016)

Mjesto i datum
Zagreb, Hrvatska, 30-30.11.2016

Vrsta sudjelovanja
Poster

Vrsta recenzije
Nije recenziran

Ključne riječi
XRD, microstructure, overlapped profiles, modelling

Sažetak
Knowledge about the microstructure is crucial in targeted synthesis of novel nanomaterials. The microstructural parameters, crystallite size and crystallite strain play a major role in physical and chemical properties of the material. X-ray diffraction (XRD) is a very suitable method for this task, since it is non-destructive and it enables a very quick and precise determination of these parameters. The main problem lies in the case where the two neighboring diffraction profiles overlap each other. Here we present a new method for the separation of the overlapping profiles based on the differentiation of the profiles. Further, this method is appropriate for non- crystallographers working in the field of material science since it does not require any crystallographic experience and the full knowledge about the structure of the sample investigated. The microstructural results obtained by the proposed method are very accurate.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Računarstvo



POVEZANOST RADA


Ustanove
Fakultet elektrotehnike i računarstva, Zagreb,
Prirodoslovno-matematički fakultet, Zagreb