How to determine microstructure from the overlapping XRD profiles - the new model (CROSBI ID 653823)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa
Podaci o odgovornosti
Dekanić, Krešimir ; Lončarić, Sven ; Skoko, Željko
engleski
How to determine microstructure from the overlapping XRD profiles - the new model
Knowledge about the microstructure is crucial in targeted synthesis of novel nanomaterials. The microstructural parameters, crystallite size and crystallite strain play a major role in physical and chemical properties of the material. X-ray diffraction (XRD) is a very suitable method for this task, since it is non-destructive and it enables a very quick and precise determination of these parameters. The main problem lies in the case where the two neighboring diffraction profiles overlap each other. Here we present a new method for the separation of the overlapping profiles based on the differentiation of the profiles. Further, this method is appropriate for non- crystallographers working in the field of material science since it does not require any crystallographic experience and the full knowledge about the structure of the sample investigated. The microstructural results obtained by the proposed method are very accurate.
XRD, microstructure, overlapped profiles, modelling
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Podaci o prilogu
2016.
objavljeno
Podaci o matičnoj publikaciji
Podaci o skupu
First Int'l Workshop on Data Science (IWDS 2016)
poster
30.11.2016-30.11.2016
Zagreb, Hrvatska