izvor podataka: crosbi
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Growth modes and electronic properties of copper ultra-thin films on a V(001) surface (CROSBI ID 77209)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Valla, Tonica ; Pervan, Petar ; Milun, Milorad ; Wandelt, Klaus
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface // Surface science, 374 (1997), 1-3; 51-60-x
Podaci o odgovornosti
Valla, Tonica ; Pervan, Petar ; Milun, Milorad ; Wandelt, Klaus
engleski
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface were studied. sp-derived QW states were identified in Cu films. Lateral structure of the films was determined.
Angle resolved photoemission; Copper; Growth; Metallic films; Thermal desorption spectroscopy; Vanadium; Work function measurements; X-ray photoelectron spectroscopy
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