Napredna pretraga

Pregled bibliografske jedinice broj: 885

Growth modes and electronic properties of copper ultra-thin films on a V(001) surface


Valla, Tonica; Pervan, Petar; Milun, Milorad; Wandelt, Klaus
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface // Surface science, 374 (1997), 1-3; 51-60 (međunarodna recenzija, članak, znanstveni)


Naslov
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface

Autori
Valla, Tonica ; Pervan, Petar ; Milun, Milorad ; Wandelt, Klaus

Izvornik
Surface science (0039-6028) 374 (1997), 1-3; 51-60

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Angle resolved photoemission; Copper; Growth; Metallic films; Thermal desorption spectroscopy; Vanadium; Work function measurements; X-ray photoelectron spectroscopy

Sažetak
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface were studied. sp-derived QW states were identified in Cu films. Lateral structure of the films was determined.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
00350108

Ustanove
Institut za fiziku, Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus