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Growth modes and electronic properties of copper ultra-thin films on a V(001) surface (CROSBI ID 77209)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Valla, Tonica ; Pervan, Petar ; Milun, Milorad ; Wandelt, Klaus Growth modes and electronic properties of copper ultra-thin films on a V(001) surface // Surface science, 374 (1997), 1-3; 51-60-x

Podaci o odgovornosti

Valla, Tonica ; Pervan, Petar ; Milun, Milorad ; Wandelt, Klaus

engleski

Growth modes and electronic properties of copper ultra-thin films on a V(001) surface

Growth modes and electronic properties of copper ultra-thin films on a V(001) surface were studied. sp-derived QW states were identified in Cu films. Lateral structure of the films was determined.

Angle resolved photoemission; Copper; Growth; Metallic films; Thermal desorption spectroscopy; Vanadium; Work function measurements; X-ray photoelectron spectroscopy

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Podaci o izdanju

374 (1-3)

1997.

51-60-x

objavljeno

0039-6028

Povezanost rada

Fizika

Indeksiranost