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Pregled bibliografske jedinice broj: 879163

Comparison of DMM characterization methods based on RMS noise and standard deviation noise


Hegeduš, Hrvoje; Konjevod, Jure; Mostarac, Petar; Malarić, Roman
Comparison of DMM characterization methods based on RMS noise and standard deviation noise // MEASUREMENT 2017, 11th International Conference on Measurement / Manka, Jan ; Tyšler, Milan ; Witkovsky, Viktor ; Frollo, Ivan (ur.).
Bratislava: Institute of Measurement Science, Slovak Academy of Sciences, 2017. str. 110-114 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
Comparison of DMM characterization methods based on RMS noise and standard deviation noise

Autori
Hegeduš, Hrvoje ; Konjevod, Jure ; Mostarac, Petar ; Malarić, Roman

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
MEASUREMENT 2017, 11th International Conference on Measurement / Manka, Jan ; Tyšler, Milan ; Witkovsky, Viktor ; Frollo, Ivan - Bratislava : Institute of Measurement Science, Slovak Academy of Sciences, 2017, 110-114

ISBN
978-80-972629-0-7

Skup
11th International Conference on Measurement

Mjesto i datum
Smolenice, Slovačka, 29-31.05. 2017

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Effective resolution, RMS noise, Standard deviation noise, Voltage range

Sažetak
Analogue to digital converters (ADCs) are very important component of digital multimeters for defining their accuracy. Along with ADC’s specifications that are described in this paper, there are also “real” parameters that describe how DMMs and ADCs fare in real world with the presence of noise. Those parameters include, but are not limited to signal-to-noise ratio, effective resolution, effective bits, noise free resolution, etc. The purpose of this paper is to test and compare different DMMs in 6, 5-7, 5 digit range using the specific formula for effective resolution.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
HRZZ-IP-2014-09-8826 - Mjeriteljska infrastruktura za pametne mreže (SMAGRIMET) (Malarić, Roman, HRZZ - 2014-09) ( POIROT)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Petar Mostarac (autor)

Avatar Url Roman Malarić (autor)

Avatar Url Hrvoje Hegeduš (autor)

Avatar Url Jure Konjevod (autor)

Poveznice na cjeloviti tekst rada:

Pristup cjelovitom tekstu rada

Citiraj ovu publikaciju:

Hegeduš, Hrvoje; Konjevod, Jure; Mostarac, Petar; Malarić, Roman
Comparison of DMM characterization methods based on RMS noise and standard deviation noise // MEASUREMENT 2017, 11th International Conference on Measurement / Manka, Jan ; Tyšler, Milan ; Witkovsky, Viktor ; Frollo, Ivan (ur.).
Bratislava: Institute of Measurement Science, Slovak Academy of Sciences, 2017. str. 110-114 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Hegeduš, H., Konjevod, J., Mostarac, P. & Malarić, R. (2017) Comparison of DMM characterization methods based on RMS noise and standard deviation noise. U: Manka, J., Tyšler, M., Witkovsky, V. & Frollo, I. (ur.)MEASUREMENT 2017, 11th International Conference on Measurement.
@article{article, author = {Hegedu\v{s}, Hrvoje and Konjevod, Jure and Mostarac, Petar and Malari\'{c}, Roman}, year = {2017}, pages = {110-114}, keywords = {Effective resolution, RMS noise, Standard deviation noise, Voltage range}, isbn = {978-80-972629-0-7}, title = {Comparison of DMM characterization methods based on RMS noise and standard deviation noise}, keyword = {Effective resolution, RMS noise, Standard deviation noise, Voltage range}, publisher = {Institute of Measurement Science, Slovak Academy of Sciences}, publisherplace = {Smolenice, Slova\v{c}ka} }
@article{article, author = {Hegedu\v{s}, Hrvoje and Konjevod, Jure and Mostarac, Petar and Malari\'{c}, Roman}, year = {2017}, pages = {110-114}, keywords = {Effective resolution, RMS noise, Standard deviation noise, Voltage range}, isbn = {978-80-972629-0-7}, title = {Comparison of DMM characterization methods based on RMS noise and standard deviation noise}, keyword = {Effective resolution, RMS noise, Standard deviation noise, Voltage range}, publisher = {Institute of Measurement Science, Slovak Academy of Sciences}, publisherplace = {Smolenice, Slova\v{c}ka} }




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