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Comparison of DMM characterization methods based on RMS noise and standard deviation noise (CROSBI ID 648732)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Hegeduš, Hrvoje ; Konjevod, Jure ; Mostarac, Petar ; Malarić, Roman Comparison of DMM characterization methods based on RMS noise and standard deviation noise // MEASUREMENT 2017, 11th International Conference on Measurement / Manka, Jan ; Tyšler, Milan ; Witkovsky, Viktor et al. (ur.). Bratislava: Institute of Measurement Science, Slovak Academy of Sciences, 2017. str. 110-114

Podaci o odgovornosti

Hegeduš, Hrvoje ; Konjevod, Jure ; Mostarac, Petar ; Malarić, Roman

engleski

Comparison of DMM characterization methods based on RMS noise and standard deviation noise

Analogue to digital converters (ADCs) are very important component of digital multimeters for defining their accuracy. Along with ADC’s specifications that are described in this paper, there are also “real” parameters that describe how DMMs and ADCs fare in real world with the presence of noise. Those parameters include, but are not limited to signal-to-noise ratio, effective resolution, effective bits, noise free resolution, etc. The purpose of this paper is to test and compare different DMMs in 6, 5-7, 5 digit range using the specific formula for effective resolution.

Effective resolution, RMS noise, Standard deviation noise, Voltage range

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Podaci o prilogu

110-114.

2017.

objavljeno

Podaci o matičnoj publikaciji

MEASUREMENT 2017, 11th International Conference on Measurement

Manka, Jan ; Tyšler, Milan ; Witkovsky, Viktor ; Frollo, Ivan

Bratislava: Institute of Measurement Science, Slovak Academy of Sciences

978-80-972629-0-7

Podaci o skupu

11th International Conference on Measurement

poster

29.05.2017-31.05.2017

Smolenice, Slovačka

Povezanost rada

Elektrotehnika