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Morphological and Fractal Analysis of Thin Ge Films Deposited by Nanosecond Pulsed Laser Ablation


Dubček, Pavo; Pivac, Branko; Krstulović, Nikša; Milošević, Slobodan; Bernstorff, Sigrid
Morphological and Fractal Analysis of Thin Ge Films Deposited by Nanosecond Pulsed Laser Ablation // Journal of nanoscience and nanotechnology, 17 (2017), 6; 4009-4016 doi:10.1166/jnn.2017.13092 (međunarodna recenzija, članak, znanstveni)


Naslov
Morphological and Fractal Analysis of Thin Ge Films Deposited by Nanosecond Pulsed Laser Ablation

Autori
Dubček, Pavo ; Pivac, Branko ; Krstulović, Nikša ; Milošević, Slobodan ; Bernstorff, Sigrid

Izvornik
Journal of nanoscience and nanotechnology (1533-4880) 17 (2017), 6; 4009-4016

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Ge, Thin Films, Pulsed Laser Deposition, Atomic Force Microscopy, Small Angle X-ray Scattering, Fractals

Sažetak
We studied the formation and growth of thin Ge films deposited by pulsed laser ablation of a Ge target onto Si substrate at room temperature in helium protective atmosphere. 4 nsec long laser pulses at 1064 nm were applied at different pulse numbers. The morphology of the process was followed by atomic force microscopy (AFM) and grazing incidence small angle X-ray scattering (GISAXS), starting from isolated particles deposition to their coalescence into film and further film growth. The analysis in the real space gives a good description of the process, however, due to a large variation in the morphology, and thus the data, the resulting information may not be so clear. We have shown that fractal analysis provides additional insight into the process. Comparing the two techniques AFM and GISAXS the latter one is much more precise since it has a more precise probing length.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
035-0352851-2856 - Laserska spektroskopija hladne plazme za obradu materijala (Slobodan Milošević, )
098-0982886-2866 - Temeljna svojstva nanostruktura i defekata u poluvodičima i dielektricima (Branko Pivac, )
HRZZ-IP-2013-11-2753 - Dijagnostika Interakcije lasera i hladne plazme (Slobodan Milošević, )
HRZZ-IP-2013-11-6135 - Poluvodičke kvantne strukture za napredne sklopove (Branko Pivac, )

Ustanove
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus
  • MEDLINE


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