engleski

Oxide film growth on Al-In alloys in a borate buffer solution in conditions of galvanostatic anodising

Anodic oxide films were formed galvanostatically on Al-In alloys (containing up to 0.074% In) in borate buffer solutions (pH 7.8) at different current densities (20 – 100  A cm-2). The mechanism, kinetics of growth and properties of formed oxide films were investigated. The study of charge curves suggests that the growth of oxide films on Al- In alloys occurs by an activation-controlled ionic conduction under the influence of the high electric field through the oxide film according to an exponential law as on valve metals. The following parameters have been calculated: the constants of the exponential law, ionic conductivity through the film, the effective activation distance for ion movement and the corresponding field strength. The values for the field strength, of the order of magnitude of 1 MV cm-1, justify the application of the high field migration mechanism. Properties of anodic oxide films have been determined by means of electrochemical impedance spectroscopy ; the resistance and thickness of the oxide film have been found to increase with the increase in the indium content in the alloy and with increased anodic current density. It has been established that oxide films on Al-In alloys form at certain current losses: the increase of the indium content in the alloy, as well as the increase in anodic current density, increases the value of current efficiency.

Al-In alloy ; Anodic oxide film ; Current efficiency ; Galvanostatic anodising ; Mechanism and kinetics of growth

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