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Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO2 films (CROSBI ID 94756)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Lučić-Lavčević, Magdy ; Turković, Aleksandra Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO2 films // Thin solid films, 419 (2002), 105-113-x

Podaci o odgovornosti

Lučić-Lavčević, Magdy ; Turković, Aleksandra

engleski

Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO2 films

Films of nanostructured titanium dioxide (TiO2) on glass substrates, prepared and annealed by different procedures ( sol-gel and chemical vapour deposition) were examined by small-angle X-ray scattering and wide-angle X-ray diffraction. By treating a film as a two-phase system of grains and pores, the corrected relative surface of phases, Svc, was introduced and calculated as a morphological parameter that combine relative surface and the volume fractions of the two phases. Its behaviour during the film annealing was predicted and tested on TiO2 films. The analysis of evolution of films during thermal annealing treatment is given by means of corrected relative surface correlated with grain size and structure.

Small-angle X-ray scattering; Wide-angle X-ray diffraction; Titanium oxide; Nanostructures

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Podaci o izdanju

419

2002.

105-113-x

objavljeno

0040-6090

Povezanost rada

Fizika

Indeksiranost