A New Compact Horizontal Current Bipolar Transistor (HCBT) Fabricated in (110) Wafers (CROSBI ID 483628)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Suligoj, Tomislav ; Wang, Kang Lung ; Koričić, Marko ; Biljanović, Petar
engleski
A New Compact Horizontal Current Bipolar Transistor (HCBT) Fabricated in (110) Wafers
A very compact Horizontal Current Bipolar Transistor (HCBT) is fabricated and tested. It is processed in <110> bulk Si substrate where the <111> crystal plane is perpendicular to the surface and is used as the active transistor sidewall. In this way, the sidewall roughness can be minimised by using crystallographic dependent etchants making the intrinsic transistor doping process highly controllable and repeatable. Hence, unlike in the existing lateral bipolar transistors, the optimum dopant contribution can be achieved what will improve transistors high-frequency performance. Additionally, HCBT is processed in simple technology with only 5 litography masks making this structure attractive for low-cost, low-power high-performance bipolar/BiCMOS applications. The improvement of f_T and f_max up to 24 and 50 GHz, respectively, can be achieved by using HCBT technology.
lateral bipolar transistor; crystallographic dependent etching
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Podaci o prilogu
607-609-x.
2002.
objavljeno
Podaci o matičnoj publikaciji
Proceedings of the ESSDERC 2002
Baccarani, G.; Gnani, E.; Rudan, M.
Bolonja: Alma Mater Studiorum Università di Bologna
Podaci o skupu
32nd European Solid-State Device Research Conference
predavanje
24.09.2002-26.09.2002
Firenca, Italija