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Analysis of 2D GISAXS patterns obtained on semiconductor nanocrystals (CROSBI ID 483531)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija

Buljan, Maja ; Salamon, Krešimir ; Dubček, Pavo ; Bernstorff, Sigrid ; Desnica-Franković, Ida-Dunja ; Milat, Ognjen ; Desnica, Uroš Analysis of 2D GISAXS patterns obtained on semiconductor nanocrystals // Final programme and book of abstracts of the 9th Joint vacuum conference : JVC-9, / Leisch, M ; Winkler, A. (ur.). Graz: Graz University of Technology, 2002. str. 86-86-x

Podaci o odgovornosti

Buljan, Maja ; Salamon, Krešimir ; Dubček, Pavo ; Bernstorff, Sigrid ; Desnica-Franković, Ida-Dunja ; Milat, Ognjen ; Desnica, Uroš

engleski

Analysis of 2D GISAXS patterns obtained on semiconductor nanocrystals

A grazing incidence small angle x-ray scattering (GISAXS) was applied in the study of semiconductor nanocrystals embedded in a light matrix. The appropriate mathematical apparatus was developed, so that a full characterization of the 3D ensemble of nanoparticles, formed in implanted layers, can be obtained from GISAXS spectra recorded on a two-dimensional (2D) detector. The GISAXS analysis was based on the local monodisperse approximation (LMA), in which the system is approximated as a sum of many monodisperse subsystems, and the total scattering is calculated as the sum of the scattering from the subsystems, weighted by the size distribution. From this analysis, the size and size distribution, shape and distance between nanoparticles could be obtained. The investigated samples were CdS nanocrystals in a SiO2 substrate, formed by ion beam synthesis. To analyze the experimental data, a series of scans were taken from the 2D patterns and fitted to the theoretical expressions for different polar angles f. Practically equal intensity profiles for a range of different f were obtained, indicating the existence of spherical nanocrystals in the probed layer. From the fits, the average particle diameter as well as the diameter distribution was determined, in excellent agreement (within 10%) with TEM results performed on the same sample. Furthermore, the average distance between the nanoparticles and the distance-distribution was resolved and correlated with implantation parameters.

CdS; GISAXS; nanocrystals

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Podaci o prilogu

86-86-x.

2002.

objavljeno

Podaci o matičnoj publikaciji

Final programme and book of abstracts of the 9th Joint vacuum conference : JVC-9,

Leisch, M ; Winkler, A.

Graz: Graz University of Technology

Podaci o skupu

9th Joint Vacuum Conference

poster

16.07.2002-20.07.2002

Leibnitz, Austrija

Povezanost rada

Fizika