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Pregled bibliografske jedinice broj: 81903

Analysis of 2D GISAXS patterns obtained on semiconductor nanocrystals


Buljan, Maja; Salamon, Krešimir; Dubček, Pavo; Bernstorff, Sigrid; Desnica-Franković, Ida-Dunja; Milat, Ognjen; Desnica, Uroš
Analysis of 2D GISAXS patterns obtained on semiconductor nanocrystals // Final programme and book of abstracts of the 9th Joint vacuum conference : JVC-9, / Leisch, M ; Winkler, A. (ur.).
Graz: Graz University of Technology, 2002. str. 86-86 (poster, međunarodna recenzija, sažetak, znanstveni)


Naslov
Analysis of 2D GISAXS patterns obtained on semiconductor nanocrystals

Autori
Buljan, Maja ; Salamon, Krešimir ; Dubček, Pavo ; Bernstorff, Sigrid ; Desnica-Franković, Ida-Dunja ; Milat, Ognjen ; Desnica, Uroš

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
Final programme and book of abstracts of the 9th Joint vacuum conference : JVC-9, / Leisch, M ; Winkler, A. - Graz : Graz University of Technology, 2002, 86-86

Skup
9th Joint Vacuum Conference

Mjesto i datum
Seggau, Austrija, 16-20.06.2002

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
CdS; GISAXS; nanocrystals

Sažetak
A grazing incidence small angle x-ray scattering (GISAXS) was applied in the study of semiconductor nanocrystals embedded in a light matrix. The appropriate mathematical apparatus was developed, so that a full characterization of the 3D ensemble of nanoparticles, formed in implanted layers, can be obtained from GISAXS spectra recorded on a two-dimensional (2D) detector. The GISAXS analysis was based on the local monodisperse approximation (LMA), in which the system is approximated as a sum of many monodisperse subsystems, and the total scattering is calculated as the sum of the scattering from the subsystems, weighted by the size distribution. From this analysis, the size and size distribution, shape and distance between nanoparticles could be obtained. The investigated samples were CdS nanocrystals in a SiO2 substrate, formed by ion beam synthesis. To analyze the experimental data, a series of scans were taken from the 2D patterns and fitted to the theoretical expressions for different polar angles f. Practically equal intensity profiles for a range of different f were obtained, indicating the existence of spherical nanocrystals in the probed layer. From the fits, the average particle diameter as well as the diameter distribution was determined, in excellent agreement (within 10%) with TEM results performed on the same sample. Furthermore, the average distance between the nanoparticles and the distance-distribution was resolved and correlated with implantation parameters.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



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