Naslov
GISAXS characterization of the ion-irradiation induced surface tracks

Autori
Buljan, Maja ; Karlušić, Marko ; Bogdanović-Radović, Ivančica ; Mekterović, Igor ; Jerčinović, Marko ; Mekterović, Darko ; Schleberger, M. ; Bernstorff, Sigrid ; Radić, Nikola

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
22nd International Scientific Meeting on Vacuum Science and Technique: Programme and Book of Abstracts / Kovač, Janez ; Jakša, Gregor - Ljubljana : Slovenian Society for Vacuum Technique, 2015, 25-25

ISBN
978-961-92989-7-8

Skup
22nd International Scientific Meeting on Vacuum Science and Technique

Mjesto i datum
Osilnica, Slovenija, 21.05.2015. - 22.05.2015

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
GISAXS; ion-irradiation; ion tracks; surface

Sažetak
Ion-irradiation of materials is a powerful tool for the design of their properties via changes induced within the ion tracks. Characterization of these changes is usually difficult, especially if the tracks are completely or partially below the surface as well as in amorphous systems where the contrast between the track and the surrounding material is low. Therefore, a simple and efficient method for the characterization of ion beam induced changes and all similar effects in materials is of great importance. Here we present models and a program for the analysis of different types of ion-irradiation induced tracks at the material surface or just below it by GISAXS (grazing incidence small angle x-ray scattering). The structure of the formed tracks is often non-continuous, i.e, the tracks consist of nano-sized structures aligned along the ion beam trajectory. The proposed method allows determination of all important ion track properties inc1uding their structure, shape, size, separation as well as all properties of the formed nano-objects for the non-continuous tracks. The efficiency of the method is demonstrated using ion tracks produced in Ge+ITO mixture film irradiated by 15 MeV Si ions. The developed models are incorporated into a new freely available program GISAXStudio for processing and analysis of materials modified by ion beams using GISAXS.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

POVEZANOST RADA