engleski

Variable Angle Spectroscopic Ellipsometry Study of PEDOT:PSS Thin Films in Contact with Air

Variable angle spectroscopic ellipsometry (VASE) is a powerful technique for studying the dielectric properties of thin films as well as their thickness. We report a VASE study in the visible and NIR region for poly(3, 4-ethylenedioxythiophene) : polystyrene sulfonate (PEDOT:PSS), a polyplex frequently used in production of soft electronic devices, spun onto silicon (100) in contact with air. The measured ellipsometric angles [] for varied angle of incidence and wavelength, can be interpreted in terms of the stratified optical layers model, which involves the complex refractive index of the film ñ(). The latter can be rationalized in terms of a dielectric function, which depends on the electrodynamic behavior of the charge carriers in the film. Thus VASE data of the studied PEDOT:PSS films of varied thicknesses, can be fitted by applying various models, whereby we compare the outcomes obtained by Tauc-Lorentz and Drude-Lorentz models.

Spectroscopic ; ellipsometry ; AFM ; PEDOT:PSS ; film ; conductivity

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