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Pregled bibliografske jedinice broj: 790402

Femtosecond spectroscopy on MoS2 flakes from liquid exfoliation: surfactant independent exciton dynamics


Vella, Danielle; Vega-Mayoral, Victor; Gadermaier, Christoph; Vujičić, Nataša; Borzda, Tetiana; Topolovšek, Peter; Prijatelj, Matej; Tempra, Iacopo; Pogna, Eva A.A.; Cerullo, Giulio
Femtosecond spectroscopy on MoS2 flakes from liquid exfoliation: surfactant independent exciton dynamics // Journal of Nanophotonics, 10 (2016), 012508-1 doi:10.1117/1.JNP.10.012508 (međunarodna recenzija, članak, znanstveni)


Naslov
Femtosecond spectroscopy on MoS2 flakes from liquid exfoliation: surfactant independent exciton dynamics

Autori
Vella, Danielle ; Vega-Mayoral, Victor ; Gadermaier, Christoph ; Vujičić, Nataša ; Borzda, Tetiana ; Topolovšek, Peter ; Prijatelj, Matej ; Tempra, Iacopo ; Pogna, Eva A.A. ; Cerullo, Giulio

Izvornik
Journal of Nanophotonics (1934-2608) 10 (2016); 012508-1

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Femtosecond spectroscopy; 2D materials; molybdenum disulfide; MoS2; exciton dynamics

Sažetak
Ionic surfactants, which are widely used to stabilize nanomaterials in dispersions, can drastically alter the nanomaterial’s photophysical properties. Here, we use femtosecond optical spectroscopy to study the dynamics of excitons and charges in few-layer flakes of the twodimensional semiconductor MoS2. We compare samples obtained via exfoliation in water with different amounts of adsorbed sodium cholate, obtained by repeated washing of the dried flakes. We find that the femtosecond dynamics is remarkably stable against the surfactant adsorption, with a slight increase of the initial exciton quenching occurring during the first few picoseconds as the only appreciable effect.

Izvorni jezik
Engleski



POVEZANOST RADA


Autor s matičnim brojem:
Nataša Vujičić, (278444)

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka:


  • INSPEC


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