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Pregled bibliografske jedinice broj: 774263

Ion beam analysis of Cu(In, Ga)Se2 thin film solar cells

Karydas, A.G.; Streeck, C.; Bogdanović-Radović, Ivančica; Kaufmann, C.; Rissom, T.; Beckhoff, B.; Jakšić, Milko; Barradas, N.P
Ion beam analysis of Cu(In, Ga)Se2 thin film solar cells // Applied surface science, 356 (2015), 631-638 doi:10.1016/j.apsusc.2015.08.133 (međunarodna recenzija, pregledni rad, znanstveni)

Ion beam analysis of Cu(In, Ga)Se2 thin film solar cells

Karydas, A.G. ; Streeck, C. ; Bogdanović-Radović, Ivančica ; Kaufmann, C. ; Rissom, T. ; Beckhoff, B. ; Jakšić, Milko ; Barradas, N.P

Applied surface science (0169-4332) 356 (2015); 631-638

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, pregledni rad, znanstveni

Ključne riječi
Thin solar Cu(In; Ga)Se2 cells; Ion beam analysis; RBS/PIXE techniques; Synchrotron GIXRF analysis; Depth profiling

The present work investigates the potential of ion beam analysis (IBA) techniques such as the Rutherford backscattering spectrometry (RBS) and particle induced X-ray emission (PIXE) using helium ions to provide quantitative in- depth elemental analysis of various types of Cu(In, Ga)Se2 thin films. These films with a thickness of about 2 μm are used as absorber layers in photovoltaic devices with continuously increasing the performance of this technology. The preparation process generally aims to obtain an in-depth gradient of In and Ga concentrations that optimizes the optoelectronic and electrical properties of the solar cell. The measurements were performed at directly accessible single or double layered CIGS absorbers and at buried absorbers in completed thin film solar cells. The IBA data were analyzed simultaneously in order to derive best fitted profiles that match all experimental RBS and PIXE spectra. For some samples elemental profiles deduced form synchrotron based, reference free grazing incidence X-ray fluorescence analysis were compared with the IBA results and an overall good agreement was observed within quoted uncertainties.

Izvorni jezik

Znanstvena područja


Projekt / tema
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Milko Jakšić, )

Institut "Ruđer Bošković", Zagreb

Časopis indeksira:

  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus