Ion beam induced luminescence (IBIL) system for imaging of radiation induced changes in materials (CROSBI ID 220529)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Marković, Nikola ; Siketić, Zdravko ; Čosić, Domagoj ; Jung, H.K. ; Lee, N. H. ; Han, W.-T. ; Jakšić, Milko
engleski
Ion beam induced luminescence (IBIL) system for imaging of radiation induced changes in materials
The progress of construction on the new IBIL (ion beam induced luminescence) spectrometer installed at the ion microprobe facility of the Rucrossed d signer Bošković Institute (RBI) is reported. The IBIL system can be used with beams from either 6.0 MV Tandem Van de Graaff or 1.0 MV Tandetron accelerators. Components of the new apparatus and current experimental set- up are described in detail. Measurements with the new IBIL system were performed using a 2 MeV proton microbeam on three sets of samples. This paper gives a summary of the IBIL arrangement capabilities for various problems, emphasising the potential of this technique for radiation damage studies. Due to the relatively good sensitivity of the IBIL spectrometer, integration into the conventional ion beam analysis (IBA) microbeam setup is shown to be possible.
Diamond; Ion beam induced luminescence; Ion microbeam; Ionoluminescence; Optical fibres
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Podaci o izdanju
343
2015.
167-172
objavljeno
0168-583X
10.1016/j.nimb.2014.11.046