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Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method (CROSBI ID 94004)

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Benčić, Zvonko ; Ilić-Roller, Dinka Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method // Automatika : časopis za automatiku, mjerenje, elektroniku, računarstvo i komunikacije, 32 (1991), 3 4; 87-93-x

Podaci o odgovornosti

Benčić, Zvonko ; Ilić-Roller, Dinka

engleski

Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method

The two-pulse method is used for calculating a device's virtual junction temperature at the end of a periodical sequence ofcurrent pulses. For a general RC-pair of the electrical model of a device's thermal circuit, the difference between normalized temperature found by means of two-pulse method and normalized accurate temperature was calculated here. Normalization factor is the maximum temperature possible for a general RC-pair. Calculation findings are shown in diagrams, and this for atransitional and stationary state. An example illustrates the use of diagrams.

Semiconductor devices; virtual junction temperature; transient thermal impedance; current ratings

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Podaci o izdanju

32 (3 4)

1991.

87-93-x

objavljeno

0005-1144

Povezanost rada

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