Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method (CROSBI ID 94004)
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Podaci o odgovornosti
Benčić, Zvonko ; Ilić-Roller, Dinka
engleski
Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method
The two-pulse method is used for calculating a device's virtual junction temperature at the end of a periodical sequence ofcurrent pulses. For a general RC-pair of the electrical model of a device's thermal circuit, the difference between normalized temperature found by means of two-pulse method and normalized accurate temperature was calculated here. Normalization factor is the maximum temperature possible for a general RC-pair. Calculation findings are shown in diagrams, and this for atransitional and stationary state. An example illustrates the use of diagrams.
Semiconductor devices; virtual junction temperature; transient thermal impedance; current ratings
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Podaci o izdanju
32 (3 4)
1991.
87-93-x
objavljeno
0005-1144