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izvor podataka: crosbi

Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films (CROSBI ID 93938)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Posedel, Dario ; Turković, Aleksandra ; Dubček, Pavo ; Crnjak Orel, Zorica Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films // Materials science & engineering. B, Solid-state materials for advanced technology, 90 (2002), 154-162. doi: 10.1016/S0921-5107(01)00933-3

Podaci o odgovornosti

Posedel, Dario ; Turković, Aleksandra ; Dubček, Pavo ; Crnjak Orel, Zorica

engleski

Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films

Grazing-incidence X-ray reflectivity, Grazing-incidence small-angle X-ray scattering, Thin films, V/Ce oxideanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel dip-coating process. Layer structure in all V/Ce oxides was revealed by grazing-incidence X-ray reflectivity method. The average grain radius <R>, obtained by grazing-icidence small-angle X-ray scattering was correlated with layer thickness.

Grazing-incidence X-ray reflectivity ; Grazing-incidence small-angle X-ray scattering ; Thin films ; V/Ce oxide

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Podaci o izdanju

90

2002.

154-162

objavljeno

0921-5107

10.1016/S0921-5107(01)00933-3

Povezanost rada

Fizika

Poveznice
Indeksiranost