Determination of nanosized particles distribution by low frequency Raman scattering: Comparison to electron microscopy (CROSBI ID 482752)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa
Podaci o odgovornosti
Ivanda, Mile ; Tonejc, Anđelka ; Djerdj, Igor ; Gotić, Marijan ; Musić, Svetozar ; Mariotto, Gino ; Montagna, Maurizio
engleski
Determination of nanosized particles distribution by low frequency Raman scattering: Comparison to electron microscopy
The methodology for the determination of nanosized particle distribution by low frequency Raman spectroscopy is described. It is based on w-1 dependence of the Raman light to vibration coupling coefficient and on the fact that each nanocrystallite of diameter D vibrates with its eigen frequency w~1/D. The effect of the particle vibrational lifetime on the shape of distribution is analyzed and found to be negligible for the free TiO2 nanoparticles. The size distributions of TiO2 nanoparticles estimated by Raman spectroscopy was compared with those of transmission electron microscopy including dark field and high resolution imaging. The Raman spectroscopy showed to be simple, fast method that has favourable statistic over the macroscopic probe volume and makes possible ''in situ'' measurements.
Raman scattering; nanocystals; high resolution TEM; particle size distribution
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Podaci o prilogu
16-27-x.
2002.
objavljeno
Podaci o matičnoj publikaciji
Nanoscale spectroscopy and its applications to semiconductor research
Watanabe, Y. ; Heun, S. ; Salviati, G. ; Yamamoto, N.
Heidelberg: Springer
Podaci o skupu
International Workshop on Nanoscale Spectroscopy and its Applications to Semiconductor Research
poster
01.01.2002-01.01.2002
Trst, Italija