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Determination of nanosized particles distribution by low frequency Raman scattering: Comparison to electron microscopy (CROSBI ID 482752)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa

Ivanda, Mile ; Tonejc, Anđelka ; Djerdj, Igor ; Gotić, Marijan ; Musić, Svetozar ; Mariotto, Gino ; Montagna, Maurizio Determination of nanosized particles distribution by low frequency Raman scattering: Comparison to electron microscopy // Nanoscale spectroscopy and its applications to semiconductor research / Watanabe, Y. ; Heun, S. ; Salviati, G. et al. (ur.). Heidelberg: Springer, 2002. str. 16-27-x

Podaci o odgovornosti

Ivanda, Mile ; Tonejc, Anđelka ; Djerdj, Igor ; Gotić, Marijan ; Musić, Svetozar ; Mariotto, Gino ; Montagna, Maurizio

engleski

Determination of nanosized particles distribution by low frequency Raman scattering: Comparison to electron microscopy

The methodology for the determination of nanosized particle distribution by low frequency Raman spectroscopy is described. It is based on w-1 dependence of the Raman light to vibration coupling coefficient and on the fact that each nanocrystallite of diameter D vibrates with its eigen frequency w~1/D. The effect of the particle vibrational lifetime on the shape of distribution is analyzed and found to be negligible for the free TiO2 nanoparticles. The size distributions of TiO2 nanoparticles estimated by Raman spectroscopy was compared with those of transmission electron microscopy including dark field and high resolution imaging. The Raman spectroscopy showed to be simple, fast method that has favourable statistic over the macroscopic probe volume and makes possible ''in situ'' measurements.

Raman scattering; nanocystals; high resolution TEM; particle size distribution

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Podaci o prilogu

16-27-x.

2002.

objavljeno

Podaci o matičnoj publikaciji

Nanoscale spectroscopy and its applications to semiconductor research

Watanabe, Y. ; Heun, S. ; Salviati, G. ; Yamamoto, N.

Heidelberg: Springer

Podaci o skupu

International Workshop on Nanoscale Spectroscopy and its Applications to Semiconductor Research

poster

01.01.2002-01.01.2002

Trst, Italija

Povezanost rada

Fizika, Kemija