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PureB layers – XRD measurements and temperature characteristics

XRD masurements are performed on the semiconductor devices with amorphous boron layers (PureB layers). Electrical simulations of the devices with PureB layers are performed and the emitter Gummel number is extracted from the simulations. Emitter Gummel number is simulated for different temperatures from which the mechanism dominating the emitter Gummel number could be deduced.

amorphous boron; PureB; Raman spectroscopy; ellipsometry; electrical measurements

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