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Pregled bibliografske jedinice broj: 722330

Reliability and Availability of Quality Control Based on Wavelet Computer Vision


Kuzmanić, Ivica; Vujović, Igor
Reliability and Availability of Quality Control Based on Wavelet Computer Vision, Berlin: Springer Berlin Heidelberg, 2014 (monografija)


Naslov
Reliability and Availability of Quality Control Based on Wavelet Computer Vision

Autori
Kuzmanić, Ivica ; Vujović, Igor

Vrsta, podvrsta i kategorija knjige
Autorske knjige, monografija, znanstvena

Izdavač
Springer Berlin Heidelberg

Grad
Berlin

Godina
2014

Stranica
100

ISBN
978-3-319-13316-4

Ključne riječi
additive noise; Markov model; multiresolution image processing; system of differential equations; vision-based algorithms; visual inspection

Sažetak
This short book presents a framework for assessing the reliability and availability of visual quality control systems, placing particular emphasis on wavelet-based analysis. It presents experimental results pertaining to the sensitivity of visual quality control to noise, as an example of dependencies. The influencing parameters are analyzed and included in the reliability model. These parameters are divided between the software and the hardware group, with one condition representing a combination of software and hardware, and another representing a combination of hardware and environmental conditions. In closing, the book suggests potential alternative approaches and examines system availability and reliability models, as well as calculations of their solutions.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika, Tehnologija prometa i transport



POVEZANOST RADA


Ustanove
Pomorski fakultet, Split

Profili:

Avatar Url Ivica Kuzmanić (autor)

Avatar Url Igor Vujović (autor)

Citiraj ovu publikaciju

Kuzmanić, Ivica; Vujović, Igor
Reliability and Availability of Quality Control Based on Wavelet Computer Vision, Berlin: Springer Berlin Heidelberg, 2014 (monografija)
Kuzmanić, I. & Vujović, I. (2014) Reliability and Availability of Quality Control Based on Wavelet Computer Vision. Berlin, Springer Berlin Heidelberg.
@book{book, year = {2014}, pages = {100}, keywords = {additive noise, Markov model, multiresolution image processing, system of differential equations, vision-based algorithms, visual inspection}, isbn = {978-3-319-13316-4}, title = {Reliability and Availability of Quality Control Based on Wavelet Computer Vision}, keyword = {additive noise, Markov model, multiresolution image processing, system of differential equations, vision-based algorithms, visual inspection}, publisher = {Springer Berlin Heidelberg}, publisherplace = {Berlin} }