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Pregled bibliografske jedinice broj: 701167

In-depth elemental characterization of Cu(In, Ga)Se2 thin film solar cells by means of RBS and PIXE techniques


Karydas, A.G.; Bogdanović Radović, Ivančica; Streeck, C.; Kaufmannd, C; Caballero, R.; Rissom, T.; Kanngießer, B.; Beckhoff, B.; Jakšić, Milko; Barradas, N.P.
In-depth elemental characterization of Cu(In, Ga)Se2 thin film solar cells by means of RBS and PIXE techniques // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 331 (2014), 93-95 doi:10.1016/j.nimb.2014.01.025 (međunarodna recenzija, članak, znanstveni)


Naslov
In-depth elemental characterization of Cu(In, Ga)Se2 thin film solar cells by means of RBS and PIXE techniques

Autori
Karydas, A.G. ; Bogdanović Radović, Ivančica ; Streeck, C. ; Kaufmannd, C ; Caballero, R. ; Rissom, T. ; Kanngießer, B. ; Beckhoff, B. ; Jakšić, Milko ; Barradas, N.P.

Izvornik
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms (0168-583X) 331 (2014); 93-95

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
CIGS ; Thin film solar cells ; RBS ; ERDA ; Data analysis

Sažetak
Thin films based on Cu(In, Ga)Se2 are used as absorber cells in photovoltaic devices. In and Ga graded depth profiles are designed to optimize the solar cell performance. Simultaneous Rutherford Backscattering Spectrometry (RBS) and Particle Induced X-ray Emission (PIXE) with 3 MeV 4He ions were used in conjunction to determine the depth profile of all the heavy elements in Cu(In, Ga)Se2 absorbers and complete solar cells. The RBS and PIXE data from one sample were analyzed synergistically, providing reliable depth profiles that satisfy all the data collected. An uncertainty analysis was done, probing the sensitivity of the analysis to different assumptions. The analytical possibilities of the combined RBS/PIXE alpha beam measurements of the CIGSe thin film solar cells, as well as the uncertainties induced in the quantitative methodology are discussed and critically assessed.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Milko Jakšić, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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