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Phonon-limited hole mobility in sub-20 nm-thick double-gate germanium MOSFETs (CROSBI ID 611274)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Ivanić, Vedran ; Poljak, Mirko ; Suligoj, Tomislav Phonon-limited hole mobility in sub-20 nm-thick double-gate germanium MOSFETs // Proceedings of the 37th International Convention MIPRO / Biljanović, Petar (ur.). Rijeka, 2014. str. 45-50

Podaci o odgovornosti

Ivanić, Vedran ; Poljak, Mirko ; Suligoj, Tomislav

engleski

Phonon-limited hole mobility in sub-20 nm-thick double-gate germanium MOSFETs

Physics-based modeling of hole mobilities in ultra-thin germanium layers is calculated with self-consistent Schödinger-Poisson solver and Kubo-Greenwood formula. Quantum confinement is taken into account for heavy, light and split-off hole band in a double-gate germanium MOSFET structure. Acoustic and optical phonon scattering is taken into consideration in the calculation of hole momentum relaxation time. The observed reduction of mobility in thinner layers is explained by examining the influence of fieldinduced and geometry-induced confinement. Contributions from different hole bands are investigated by calculating band population and respective band mobilities.

ultra-thin body; germanium; MOSFET; hole mobility; quantum confinement; scattering

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Podaci o prilogu

45-50.

2014.

objavljeno

Podaci o matičnoj publikaciji

Proceedings of the 37th International Convention MIPRO

Biljanović, Petar

Rijeka:

978-953-233-078-6

Podaci o skupu

MIPRO 2014

predavanje

25.05.2014-29.05.2014

Opatija, Hrvatska

Povezanost rada

Elektrotehnika