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Pregled bibliografske jedinice broj: 694906

Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties


Vieira, E.M.F.; Martín-Sánchez, J.; Roldan, M.A.; Varela, M.; Buljan, Maja; Bernstorff, Sigrid; Barradas, N.P.; Franco, N.; Correia, M.R.; Rolo, A.G. et al.
Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties // Journal of physics. D, Applied physics, 46 (2013), 38; 385301-1 doi:10.1088/0022-3727/46/38/385301 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 694906 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties

Autori
Vieira, E.M.F. ; Martín-Sánchez, J. ; Roldan, M.A. ; Varela, M. ; Buljan, Maja ; Bernstorff, Sigrid ; Barradas, N.P. ; Franco, N. ; Correia, M.R. ; Rolo, A.G. ; Pennycook, S.J. ; Molina, S..I ; Alves, E. ; Chahboun, A. ; Gomes, M.J.M.

Izvornik
Journal of physics. D, Applied physics (0022-3727) 46 (2013), 38; 385301-1

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
surfaces; interfaces and thin films; Nanoscale science and low-D systems

Sažetak
In this work, we investigate the structural and photoluminescence (PL) properties of (SiGe+Al2O3)/Al2O3 multi-layer films with layer thicknesses in the range of a few nanometres. The films were prepared by magnetron sputtering deposition at room temperature followed by an annealing process to promote the formation of small SiGe nanocrystals (NCs) (~3 to 5 nm) embedded between ultra-thin (~6 nm thickness) Al2O3 layers. Our results show that the structural and compositional properties of the films can be tuned by changing the RF-power. It is found that nearly spherical and well confined isolated SiGe NCs (~5 nm) are obtained for an RF-power value of 80 W. The PL properties of the films were studied and optical emission in the blue visible wavelength region was observed.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-0982886-2859 - Sinergija nanofaza i nanokompozita (Mičetić, Maja, MZOS ) ( POIROT)
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Radić, Nikola, MZOS ) ( POIROT)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Maja Mičetić (autor)

Poveznice na cjeloviti tekst rada:

doi iopscience.iop.org dx.doi.org

Citiraj ovu publikaciju:

Vieira, E.M.F.; Martín-Sánchez, J.; Roldan, M.A.; Varela, M.; Buljan, Maja; Bernstorff, Sigrid; Barradas, N.P.; Franco, N.; Correia, M.R.; Rolo, A.G. et al.
Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties // Journal of physics. D, Applied physics, 46 (2013), 38; 385301-1 doi:10.1088/0022-3727/46/38/385301 (međunarodna recenzija, članak, znanstveni)
Vieira, E., Martín-Sánchez, J., Roldan, M., Varela, M., Buljan, M., Bernstorff, S., Barradas, N., Franco, N., Correia, M. & Rolo, A. (2013) Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties. Journal of physics. D, Applied physics, 46 (38), 385301-1 doi:10.1088/0022-3727/46/38/385301.
@article{article, author = {Vieira, E.M.F. and Mart\'{\i}n-S\'{a}nchez, J. and Roldan, M.A. and Varela, M. and Buljan, Maja and Bernstorff, Sigrid and Barradas, N.P. and Franco, N. and Correia, M.R. and Rolo, A.G. and Pennycook, S.J. and Molina, S..I and Alves, E. and Chahboun, A. and Gomes, M.J.M.}, year = {2013}, pages = {385301-1-385301-10}, DOI = {10.1088/0022-3727/46/38/385301}, keywords = {surfaces, interfaces and thin films, Nanoscale science and low-D systems}, journal = {Journal of physics. D, Applied physics}, doi = {10.1088/0022-3727/46/38/385301}, volume = {46}, number = {38}, issn = {0022-3727}, title = {Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties}, keyword = {surfaces, interfaces and thin films, Nanoscale science and low-D systems} }
@article{article, author = {Vieira, E.M.F. and Mart\'{\i}n-S\'{a}nchez, J. and Roldan, M.A. and Varela, M. and Buljan, Maja and Bernstorff, Sigrid and Barradas, N.P. and Franco, N. and Correia, M.R. and Rolo, A.G. and Pennycook, S.J. and Molina, S..I and Alves, E. and Chahboun, A. and Gomes, M.J.M.}, year = {2013}, pages = {385301-1-385301-10}, DOI = {10.1088/0022-3727/46/38/385301}, keywords = {surfaces, interfaces and thin films, Nanoscale science and low-D systems}, journal = {Journal of physics. D, Applied physics}, doi = {10.1088/0022-3727/46/38/385301}, volume = {46}, number = {38}, issn = {0022-3727}, title = {Influence of RF-sputtering power on formation of vertically stacked Si1−xGex nanocrystals between ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties}, keyword = {surfaces, interfaces and thin films, Nanoscale science and low-D systems} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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