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Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons (CROSBI ID 609838)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Poljak, Mirko ; Wang, Kang L. ; Suligoj, Tomislav Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons // Proceedings of the International Conference on Ultimate Integration on Silicon (ULIS) 2014 / Mikael Ostling ; Per-Erik Hellstrom ; Gunnar Malm (ur.). Stockholm: KTH, 2014. str. 1-4

Podaci o odgovornosti

Poljak, Mirko ; Wang, Kang L. ; Suligoj, Tomislav

engleski

Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons

We report the results of a multi-scale transport modeling of ultra-narrow GNRs. Atomistic NEGF approach is combined with semiclassical mobility modeling in order to quantify the sensitivity of mobility to edge defects. We find that the mobility in defected GNRs deteriorates more strongly as GNR width is scaled down compared to ideal devices, and that even the minimum mobility variation spans almost one order of magnitude.

graphene nanoribbon; mobility; transmission; NEGF; edge defects; variability; sensitivity

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Podaci o prilogu

1-4.

2014.

objavljeno

Podaci o matičnoj publikaciji

Proceedings of the International Conference on Ultimate Integration on Silicon (ULIS) 2014

Mikael Ostling ; Per-Erik Hellstrom ; Gunnar Malm

Stockholm: KTH

Podaci o skupu

International Conference on Ultimate Integration on Silicon (ULIS) 2014

predavanje

07.04.2014-09.04.2014

Stockholm, Švedska

Povezanost rada

Elektrotehnika