Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons (CROSBI ID 609838)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Poljak, Mirko ; Wang, Kang L. ; Suligoj, Tomislav
engleski
Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons
We report the results of a multi-scale transport modeling of ultra-narrow GNRs. Atomistic NEGF approach is combined with semiclassical mobility modeling in order to quantify the sensitivity of mobility to edge defects. We find that the mobility in defected GNRs deteriorates more strongly as GNR width is scaled down compared to ideal devices, and that even the minimum mobility variation spans almost one order of magnitude.
graphene nanoribbon; mobility; transmission; NEGF; edge defects; variability; sensitivity
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Podaci o prilogu
1-4.
2014.
objavljeno
Podaci o matičnoj publikaciji
Proceedings of the International Conference on Ultimate Integration on Silicon (ULIS) 2014
Mikael Ostling ; Per-Erik Hellstrom ; Gunnar Malm
Stockholm: KTH
Podaci o skupu
International Conference on Ultimate Integration on Silicon (ULIS) 2014
predavanje
07.04.2014-09.04.2014
Stockholm, Švedska