Simultaneous GISAXS/GIXD measurements of nanostructures in ZnO thin films (CROSBI ID 607503)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Lučić Lavčević, Magdi ; Bernstorff, Sigrid ; Dubček, Pavo ; Šilović, Lucija
engleski
Simultaneous GISAXS/GIXD measurements of nanostructures in ZnO thin films
Thin films with ZnO nanostructures were obtained by combined preparation methods on different substrates. Analysis of the film morphologies, based on simultaneous GISAXS/GID measurements, is given.
ZnO; thin film; nanostructure; GISAXS; GID
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Podaci o prilogu
2012.
objavljeno
Podaci o matičnoj publikaciji
Conference (JVC 14) and 12th European Vacuum Conference (EVC 12) and 11th Annual Meeting of the German Vacuum Society (AMDVG 11) and 9th Croatian - Slovenian Vacuum Meeting (CROSLOVM 19) : Programme and book of abstracts
N. Radić, S. Milošević
Zagreb: Hrvatsko Vakuumsko Društvo (HVD)
Podaci o skupu
14th Joint Vacuum Conference - 12th European Vacuum Conference - 11th Annual Meeting of the German Vacuum Society - 19th Croatian-Slovenian Vacuum Meeting
poster
04.06.2012-08.06.2012
Dubrovnik, Hrvatska
