The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods (CROSBI ID 480540)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Gracin, Davor ; Dutta, J.M. ; Borjanović, Vesna ; Vlahović, Branimir ; Bogdanović, Ivančica ; Jakšić, Milko ; Nemanich, R.J.
engleski
The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods
The amorphous hydrogenated silicon carbide thin films were deposited in wide composition range and under various deposition conditions. The film composition and concentration of chemical bonding have been measured by RBS, ERDA, FTIR and Raman spectroscopy. The compatibility and accuracy of applied methods in quantitative analysis has been discussed and degree of chemical ordering has been estimated.
chemical ordering; FTIR; Raman; RBS; ERDA
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Podaci o prilogu
225-226-x.
2000.
objavljeno
Podaci o matičnoj publikaciji
Program and Proceedings NCPV Program Review Meeting
Denver (CO): NREL, Sandia National Laboratories
Podaci o skupu
National center for photovoltaics program review meeting, 2000
poster
16.04.2000-19.04.2000
Denver (CO), Sjedinjene Američke Države
