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Pregled bibliografske jedinice broj: 68023

The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods


Gracin, Davor; Dutta, J.M.; Borjanović, Vesna; Vlahović, Branimir; Bogdanović, Ivančica; Jakšić, Milko; Nemanich, R.J.
The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods // Program and Proceedings NCPV Program Review Meeting
Denver, Colorado, USA: NREL, Sandia National Laboratories, 2000. str. 225-226 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


Naslov
The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods

Autori
Gracin, Davor ; Dutta, J.M. ; Borjanović, Vesna ; Vlahović, Branimir ; Bogdanović, Ivančica ; Jakšić, Milko ; Nemanich, R.J.

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Program and Proceedings NCPV Program Review Meeting / - Denver, Colorado, USA : NREL, Sandia National Laboratories, 2000, 225-226

Skup
National center for photovoltaics program review meeting, 2000

Mjesto i datum
Denver, Kolorado, SAD, 16-19.04.2000

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Chemical ordering; FTIR; Raman; RBS; ERDA

Sažetak
The amorphous hydrogenated silicon carbide thin films were deposited in wide composition range and under various deposition conditions. The film composition and concentration of chemical bonding have been measured by RBS, ERDA, FTIR and Raman spectroscopy. The compatibility and accuracy of applied methods in quantitative analysis has been discussed and degree of chemical ordering has been estimated.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
00980206
00980302
036009

Ustanove
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb