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Pregled bibliografske jedinice broj: 653489

Metal island film-based structures for sensing using spectrophotometry and ellipsometry


Janicki, Vesna; Sancho-Parramon, Jordi; Bosch, Salvador; Zorc, Hrvoje; Belarre, Francesc; Arbiol, Jordi
Metal island film-based structures for sensing using spectrophotometry and ellipsometry // Applied physics. A, Materials science & processing, 115 (2014), 2; 481-486 doi:10.1007/s00339-013-8056-x (međunarodna recenzija, članak, znanstveni)


Naslov
Metal island film-based structures for sensing using spectrophotometry and ellipsometry

Autori
Janicki, Vesna ; Sancho-Parramon, Jordi ; Bosch, Salvador ; Zorc, Hrvoje ; Belarre, Francesc ; Arbiol, Jordi

Izvornik
Applied physics. A, Materials science & processing (0947-8396) 115 (2014), 2; 481-486

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Thin films; sensors; surface plasmon resonsnce; nanocomposites; metal island films

Sažetak
Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Hrvoje Zorc, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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