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izvor podataka: crosbi

Metal island film-based structures for sensing using spectrophotometry and ellipsometry (CROSBI ID 197413)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Janicki, Vesna ; Sancho-Parramon, Jordi ; Bosch, Salvador ; Zorc, Hrvoje ; Belarre, Francesc ; Arbiol, Jordi Metal island film-based structures for sensing using spectrophotometry and ellipsometry // Applied physics. A, Materials science & processing, 115 (2014), 2; 481-486. doi: 10.1007/s00339-013-8056-x

Podaci o odgovornosti

Janicki, Vesna ; Sancho-Parramon, Jordi ; Bosch, Salvador ; Zorc, Hrvoje ; Belarre, Francesc ; Arbiol, Jordi

engleski

Metal island film-based structures for sensing using spectrophotometry and ellipsometry

Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.

thin films; sensors; surface plasmon resonsnce; nanocomposites; metal island films

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Podaci o izdanju

115 (2)

2014.

481-486

objavljeno

0947-8396

10.1007/s00339-013-8056-x

Povezanost rada

Fizika

Poveznice
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