Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

Bistable Nanoelectromechanical Devices (CROSBI ID 196287)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Ziegler, Kirk J. ; Lyons, Daniel Mark ; Holmes, Justin D. ; Erts, Donats ; Polyakov, Boris ; Olin, Hakan ; Svensson, Krister ; Olsson, Eva Bistable Nanoelectromechanical Devices // Applied physics letters, 84 (2004), 20; 4074-4076. doi: 10.1063/1.1751622

Podaci o odgovornosti

Ziegler, Kirk J. ; Lyons, Daniel Mark ; Holmes, Justin D. ; Erts, Donats ; Polyakov, Boris ; Olin, Hakan ; Svensson, Krister ; Olsson, Eva

engleski

Bistable Nanoelectromechanical Devices

A combined transmission electron microscopy-scanning tunneling microscopy ~TEM-STM! technique has been used to investigate the force interactions of silicon and germanium nanowires with gold electrodes. The I(V) data obtained typically show linear behavior between the gold electrode and silicon nanowires at all contact points, whereas the linearity of I(V) curves obtained for germanium nanowires were dependent on the point of contact. Bistable silicon and germanium nanowire-based nanoelectromechanical programmable read-only memory ~NEMPROM! devices were demonstrated by TEM-STM. These nonvolatile NEMPROM devices have switching potentials as low as 1 V and are highly stable making them ideal candidates for low-leakage electronic devices.

nanowire

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o izdanju

84 (20)

2004.

4074-4076

objavljeno

0003-6951

10.1063/1.1751622

Povezanost rada

Fizika, Kemija

Poveznice
Indeksiranost