Noble Metal Island Films for Optical Coatings - Tailoring their Optical Properties and Characterization by Spectroscopic Ellipsometry (CROSBI ID 596902)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Lončarić, Martin ; Zorc, Hrvoje
engleski
Noble Metal Island Films for Optical Coatings - Tailoring their Optical Properties and Characterization by Spectroscopic Ellipsometry
Metal island fi lms of noble metals (silver, copper and gold) show unique optical properties due to the localized surface plasmon resonance of free electrons in metal nanoparticles. Strong plasmonic absorption at specifi c wavelengths, which depends on the particle size, shape, spatial distribution and dielectric environment, may be widely tailored varying production parameters. This makes these fi lms attractive for design of optical coatings beside usual dielectric layers. Noble metal island fi lms were produced using e-beam evaporation, embedded between diff erent combinations of TiO2 and/or SiO2 layers, on BK7 glass substrates. The tailoring of optical properties of the samples was done by changing mass thickness of deposited material and using diff erent dielectric layers above and below the metal island fi lm. The optical properties of noble metal island fi lms embedded between dielectric layers have been explored using effi cient procedure developed for optical characterization using spectroscopic ellipsometry. This procedure is based on modeling the dispersion of eff ective optical constants using a multiple oscillator approach. Thus obtained optical constants are prerequisite for implementation of noble metal island fi lms in the design of multilayer optical coatings for diff erent applications.
plasmonic materials; metal island films; optical coatings; spectroscopic ellipsometry
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Podaci o prilogu
24-24.
2013.
objavljeno
Podaci o matičnoj publikaciji
Final Program Abstracts for the 2013 SVC Technical Conference
Scott, Walton
Albuquerque (NM): Society of Vacuum Coaters
Podaci o skupu
56th Annual SVC Technical Conference
poster
22.04.2013-25.04.2013
Providence (RI), Sjedinjene Američke Države