Metal island film based structures for sensing using spectrophotometry and ellipsometry (CROSBI ID 596892)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Janicki, Vesna ; Sancho-Parramon, Jordi ; Bosch, Salvador ; Zorc, Hrvoje
engleski
Metal island film based structures for sensing using spectrophotometry and ellipsometry
Metal island films (MIF) are good candidates for sensors due to environment refractive index sensitive localized surface plasmon resonance. The strong near field enhancement in the vicinity of the island surface can be even higher if metal layer (ML) is placed close to MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of measurements compared. It is shown that simple MIF is preferable for ellipsometric and including ML for spectrophotometric sensing
metal islands; sensing; surface plasmon resonance; ellipsometry
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Podaci o prilogu
2013.
objavljeno
Podaci o matičnoj publikaciji
Podaci o skupu
META 13, The 4th International Conference on Metamaterials, Photonic Crystals and Plasmonics
poster
18.02.2013-22.02.2013
Sharjah, Ujedinjeni Arapski Emirati