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Pregled bibliografske jedinice broj: 629251

X-ray small-angle scattering from sputtered CeO2=C bilayers


Haviar, S.; Dubau, M.; Khalakhan, I.; Vorokhta, M.; Matolınova, I.; Matolın, V.; Vale, Vaclav S.; Endres, Jan; Holy, Vaclav; Buljan, Maja; Bernstorff, Sigrid
X-ray small-angle scattering from sputtered CeO2=C bilayers // Journal of applied physics, 113 (2013), 2; 024301-1 doi:10.1063/1.4773446 (međunarodna recenzija, članak, znanstveni)


Naslov
X-ray small-angle scattering from sputtered CeO2=C bilayers

Autori
Haviar, S. ; Dubau, M. ; Khalakhan, I. ; Vorokhta, M. ; Matolınova, I. ; Matolın, V. ; Vale, Vaclav S. ; Endres, Jan ; Holy, Vaclav ; Buljan, Maja ; Bernstorff, Sigrid

Izvornik
Journal of applied physics (0021-8979) 113 (2013), 2; 024301-1

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Atomic force microscopy; carbon; catalysts; cerium compounds; interface structure; metal-insulator boundaries; scanning electron microscopy; sputter deposition; thin films; X-ray scattering

Sažetak
Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting layers is investigated. The applicability of x-ray scattering and its advantages over standard analytical methods are discussed.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0982886-2859 - Sinergija nanofaza i nanokompozita (Maja Buljan, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Autor s matičnim brojem:
Maja Buljan, (242416)

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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