engleski

X-ray small-angle scattering from sputtered CeO2=C bilayers

Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting layers is investigated. The applicability of x-ray scattering and its advantages over standard analytical methods are discussed.

atomic force microscopy; carbon; catalysts; cerium compounds; interface structure; metal-insulator boundaries; scanning electron microscopy; sputter deposition; thin films; X-ray scattering

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