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Pregled bibliografske jedinice broj: 629251

X-ray small-angle scattering from sputtered CeO2=C bilayers


Haviar, S.; Dubau, M.; Khalakhan, I.; Vorokhta, M.; Matolınova, I.; Matolın, V.; Vale, Vaclav S.; Endres, Jan; Holy, Vaclav; Buljan, Maja; Bernstorff, Sigrid
X-ray small-angle scattering from sputtered CeO2=C bilayers // Journal of applied physics, 113 (2013), 2; 024301-1 doi:10.1063/1.4773446 (međunarodna recenzija, članak, znanstveni)


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Naslov
X-ray small-angle scattering from sputtered CeO2=C bilayers

Autori
Haviar, S. ; Dubau, M. ; Khalakhan, I. ; Vorokhta, M. ; Matolınova, I. ; Matolın, V. ; Vale, Vaclav S. ; Endres, Jan ; Holy, Vaclav ; Buljan, Maja ; Bernstorff, Sigrid

Izvornik
Journal of applied physics (0021-8979) 113 (2013), 2; 024301-1

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
atomic force microscopy; carbon; catalysts; cerium compounds; interface structure; metal-insulator boundaries; scanning electron microscopy; sputter deposition; thin films; X-ray scattering

Sažetak
Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting layers is investigated. The applicability of x-ray scattering and its advantages over standard analytical methods are discussed.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-0982886-2859 - Sinergija nanofaza i nanokompozita (Mičetić, Maja, MZOS ) ( POIROT)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Maja Mičetić (autor)

Poveznice na cjeloviti tekst rada:

doi dx.doi.org scitation.aip.org

Citiraj ovu publikaciju:

Haviar, S.; Dubau, M.; Khalakhan, I.; Vorokhta, M.; Matolınova, I.; Matolın, V.; Vale, Vaclav S.; Endres, Jan; Holy, Vaclav; Buljan, Maja; Bernstorff, Sigrid
X-ray small-angle scattering from sputtered CeO2=C bilayers // Journal of applied physics, 113 (2013), 2; 024301-1 doi:10.1063/1.4773446 (međunarodna recenzija, članak, znanstveni)
Haviar, S., Dubau, M., Khalakhan, I., Vorokhta, M., Matolınova, I., Matolın, V., Vale, V., Endres, J., Holy, V., Buljan, M. & Bernstorff, S. (2013) X-ray small-angle scattering from sputtered CeO2=C bilayers. Journal of applied physics, 113 (2), 024301-1 doi:10.1063/1.4773446.
@article{article, author = {Haviar, S. and Dubau, M. and Khalakhan, I. and Vorokhta, M. and Matol\inova, I. and Matol\in, V. and Vale, Vaclav S. and Endres, Jan and Holy, Vaclav and Buljan, Maja and Bernstorff, Sigrid}, year = {2013}, pages = {024301-1-024301-7}, DOI = {10.1063/1.4773446}, keywords = {atomic force microscopy, carbon, catalysts, cerium compounds, interface structure, metal-insulator boundaries, scanning electron microscopy, sputter deposition, thin films, X-ray scattering}, journal = {Journal of applied physics}, doi = {10.1063/1.4773446}, volume = {113}, number = {2}, issn = {0021-8979}, title = {X-ray small-angle scattering from sputtered CeO2=C bilayers}, keyword = {atomic force microscopy, carbon, catalysts, cerium compounds, interface structure, metal-insulator boundaries, scanning electron microscopy, sputter deposition, thin films, X-ray scattering} }
@article{article, author = {Haviar, S. and Dubau, M. and Khalakhan, I. and Vorokhta, M. and Matol\inova, I. and Matol\in, V. and Vale, Vaclav S. and Endres, Jan and Holy, Vaclav and Buljan, Maja and Bernstorff, Sigrid}, year = {2013}, pages = {024301-1-024301-7}, DOI = {10.1063/1.4773446}, keywords = {atomic force microscopy, carbon, catalysts, cerium compounds, interface structure, metal-insulator boundaries, scanning electron microscopy, sputter deposition, thin films, X-ray scattering}, journal = {Journal of applied physics}, doi = {10.1063/1.4773446}, volume = {113}, number = {2}, issn = {0021-8979}, title = {X-ray small-angle scattering from sputtered CeO2=C bilayers}, keyword = {atomic force microscopy, carbon, catalysts, cerium compounds, interface structure, metal-insulator boundaries, scanning electron microscopy, sputter deposition, thin films, X-ray scattering} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





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