Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi !

Absolute phase mapping for one-shot dense pattern projection (CROSBI ID 595561)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Fernandez, Sergio ; Salvi, Joaquim ; Pribanic, Tomislav Absolute phase mapping for one-shot dense pattern projection // Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on / Mortensen, Eric ; Yang, Ming-Hsuan (ur.). San Francisco (CA): Institute of Electrical and Electronics Engineers (IEEE), 2010. str. 64-71

Podaci o odgovornosti

Fernandez, Sergio ; Salvi, Joaquim ; Pribanic, Tomislav

engleski

Absolute phase mapping for one-shot dense pattern projection

The use of one-shot pattern projection to obtain 3D dense reconstruction constitutes a promising field of research in structured light. Most of the related works presented in the literature are based on the projection of a fringe pattern to extract depth from phase deviation. However, the algorithms employed to unwrap the phase are computationally slow and can fail under certain slopes and occlusions in the object shape. In these lines, a color oneshot dense reconstruction using fringe pattern projection and wavelet decomposition is presented. Moreover, a novel phase unwrapping algorithm is proposed, providing a fast and reliable absolute phase map for depth reconstruction.

Phase unwrapping; structured light; 3D reconstruction

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o prilogu

64-71.

2010.

objavljeno

Podaci o matičnoj publikaciji

Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on

Mortensen, Eric ; Yang, Ming-Hsuan

San Francisco (CA): Institute of Electrical and Electronics Engineers (IEEE)

978-1-4244-7029-7

2160-7508

Podaci o skupu

The Twenty-Third IEEE Computer Society Conference on Computer Vision and Pattern Recognition

predavanje

13.06.2010-18.06.2010

San Francisco (CA), Sjedinjene Američke Države

Povezanost rada

Elektrotehnika, Računarstvo