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Pregled bibliografske jedinice broj: 596200

Oscillations in spectral behaviour of total losses (1-R-T) in thin dielectric films


Amotchkina, T.V.; Trubetskov, M.K.; Tikhonravov, A.V.; Janicki, Vesna; Sancho-Parramon, Jordi; Razskazovskaya, O.; Pervak, V.
Oscillations in spectral behaviour of total losses (1-R-T) in thin dielectric films // Optics express, 20 (2012), 16129-16144 doi:10.1364/OE.20.016129 (međunarodna recenzija, članak, znanstveni)


Naslov
Oscillations in spectral behaviour of total losses (1-R-T) in thin dielectric films

Autori
Amotchkina, T.V. ; Trubetskov, M.K. ; Tikhonravov, A.V. ; Janicki, Vesna ; Sancho-Parramon, Jordi ; Razskazovskaya, O. ; Pervak, V.

Izvornik
Optics express (1094-4087) 20 (2012); 16129-16144

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Materials and process characterization; Interference coatings; Thin films; optical properties; Deposition and fabrication

Sažetak
We explain reasons of oscillations frequently observed in total losses spectra (1−R−T) calculated on the basis of measurement spectral photometric data of thin film samples. The first reason of oscillations is related to difference in angles of incidence at which spectral transmittance and reflectance are measured. The second reason is an absorption in a thin film. The third reason is a slight thickness non-uniformity of the film. We observe a good agreement between theoretical models and corresponding measurements, which proves above statements on the origins of oscillations in total losses.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Hrvoje Zorc, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus
  • MEDLINE


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