Micron slices of lead for assessment of alpha particle emission in computer chip manufacturing (CROSBI ID 477761)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Momčilović, Berislav ; Lykken, G.I ; Nitsche, C.
engleski
Micron slices of lead for assessment of alpha particle emission in computer chip manufacturing
Lead micron slices are suitable for the assessment of the risk of alpha particle emission which are the cause of soft error in computer chip manufacturing.
lead micron slices; alpha particle emission; computer chip; soft error
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o prilogu
A138-x.
2000.
objavljeno
Podaci o matičnoj publikaciji
129th Annual Meeting of the Minerals,Metals, and Materials Society
The Minerals, Metals, and Materials Society
Nashville (TN): The Minerals, Metals, and Materials Society
Podaci o skupu
129th Annual Meeting of the Minerals, Metals, and Materials Society
predavanje
07.05.2000-12.05.2000
Nashville (TN), Sjedinjene Američke Države
