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Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection (CROSBI ID 580954)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Šakić, Agata ; Nanver, Lis K. ; Van Veen, Gerard ; Kooijman, Kees ; Vogelsang, Patrick ; Scholtes, T. L. M. ; De Boer, W. B. ; Wien, W. ; Milosavljević, Silvana ; Heerkens, C. T. H. et al. Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection // Technical Digest - International Electron Devices Meeting. San Francisco (CA): Institute of Electrical and Electronics Engineers (IEEE), 2010. str. 31.4.1-31.4.4

Podaci o odgovornosti

Šakić, Agata ; Nanver, Lis K. ; Van Veen, Gerard ; Kooijman, Kees ; Vogelsang, Patrick ; Scholtes, T. L. M. ; De Boer, W. B. ; Wien, W. ; Milosavljević, Silvana ; Heerkens, C. T. H. ; Knežević, Tihomir ; Spee, I.

engleski

Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

A new silicon electron detector technology for Scanning Electron Microscopy, based on ultrashallow p+n boron-layer photodiodes, features nm-thin anodes enabling low-energy electron detection with record-high sensitivity down to 200 eV. Designs with segmented, closely-packed photodiodes and through-wafer apertures allow flexible configurations for optimal material and/or topographical contrasts. A high scanning speed is obtained by growing a well-controlled, lightly-doped, tens-of-microns-thick epi-layer for low capacitance, and by patterning a conductive grid directly on the photosensitive surface for low series resistance.

Electron detection; Electron detectors; High efficiency; High sensitivity; Low energy electrons; Silicon photodiode; Scanning electron microscopy

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Podaci o prilogu

31.4.1-31.4.4.

2010.

objavljeno

Podaci o matičnoj publikaciji

Technical Digest - International Electron Devices Meeting

San Francisco (CA): Institute of Electrical and Electronics Engineers (IEEE)

978-1-4424-7418-5

Podaci o skupu

IEEE International Electron Devices Meeting

predavanje

06.12.2010-08.12.2010

San Francisco (CA), Sjedinjene Američke Države

Povezanost rada

Elektrotehnika