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Pregled bibliografske jedinice broj: 550198

Structural analysis of monolayered and bilayered SnO2 thin films


Đerđ, Igor; Gracin, Davor; Juraić, Krunoslav; Meljanac, Daniel; Bogdanović Radović, Ivančica; Pletikapić, Galja
Structural analysis of monolayered and bilayered SnO2 thin films // Surface & coatings technology, 211 (2012), 24-28 doi:10.1016/j.surfcoat.2011.06.045 (međunarodna recenzija, članak, znanstveni)


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Naslov
Structural analysis of monolayered and bilayered SnO2 thin films

Autori
Đerđ, Igor ; Gracin, Davor ; Juraić, Krunoslav ; Meljanac, Daniel ; Bogdanović Radović, Ivančica ; Pletikapić, Galja

Izvornik
Surface & coatings technology (0257-8972) 211 (2012); 24-28

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
transparent conductive oxides ; thin film ; X-ray diffraction ; Rietveld analysis ; preferred orientation

Sažetak
Mono- and bilayered undoped and fluorine doped SnO2 thin films have been successfully prepared at optimized postdeposition temperatures of 590 and 610 °C by the atmospheric pressure chemical vapor deposition method. The microstructural properties of as-deposited films were thoroughly examined using the Rietveld refinement of powder-like XRD patterns, while the film surface has been probed using atomic field microscopy. The structural parameters were correlated to the deposition parameters and interesting findings were revealed. Finally, the specific electrical resistivity of the thin films has been measured and correlated with the optical transmittance.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( POIROT)
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( POIROT)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Citiraj ovu publikaciju

Đerđ, Igor; Gracin, Davor; Juraić, Krunoslav; Meljanac, Daniel; Bogdanović Radović, Ivančica; Pletikapić, Galja
Structural analysis of monolayered and bilayered SnO2 thin films // Surface & coatings technology, 211 (2012), 24-28 doi:10.1016/j.surfcoat.2011.06.045 (međunarodna recenzija, članak, znanstveni)
Đerđ, I., Gracin, D., Juraić, K., Meljanac, D., Bogdanović Radović, I. & Pletikapić, G. (2012) Structural analysis of monolayered and bilayered SnO2 thin films. Surface & coatings technology, 211, 24-28 doi:10.1016/j.surfcoat.2011.06.045.
@article{article, year = {2012}, pages = {24-28}, DOI = {10.1016/j.surfcoat.2011.06.045}, keywords = {transparent conductive oxides, thin film, X-ray diffraction, Rietveld analysis, preferred orientation}, journal = {Surface and coatings technology}, doi = {10.1016/j.surfcoat.2011.06.045}, volume = {211}, issn = {0257-8972}, title = {Structural analysis of monolayered and bilayered SnO2 thin films}, keyword = {transparent conductive oxides, thin film, X-ray diffraction, Rietveld analysis, preferred orientation} }
@article{article, year = {2012}, pages = {24-28}, DOI = {10.1016/j.surfcoat.2011.06.045}, keywords = {transparent conductive oxides, thin film, X-ray diffraction, Rietveld analysis, preferred orientation}, journal = {Surface and coatings technology}, doi = {10.1016/j.surfcoat.2011.06.045}, volume = {211}, issn = {0257-8972}, title = {Structural analysis of monolayered and bilayered SnO2 thin films}, keyword = {transparent conductive oxides, thin film, X-ray diffraction, Rietveld analysis, preferred orientation} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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