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Pregled bibliografske jedinice broj: 539866

Comparison of two techniques for reliable characterization of thin metal–dielectric films


Amotchkina, Tatiana; Trubetskov, Michael; Tikhonravov, Alexander; Janicki, Vesna; Sancho-Parramon, Jordi; Zorc, Hrvoje
Comparison of two techniques for reliable characterization of thin metal–dielectric films // Applied optics, 50 (2011), 33; 6189-6197 doi:10.1364/AO.50.006189 (međunarodna recenzija, članak, znanstveni)


Naslov
Comparison of two techniques for reliable characterization of thin metal–dielectric films

Autori
Amotchkina, Tatiana ; Trubetskov, Michael ; Tikhonravov, Alexander ; Janicki, Vesna ; Sancho-Parramon, Jordi ; Zorc, Hrvoje

Izvornik
Applied optics (0003-6935) 50 (2011), 33; 6189-6197

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Interference coatings; deposition and fabrication; materials and process characterization; thin films optical properties; metallic; opaque and absorbing coatings

Sažetak
In the present study we determine the optical parameters of thin metal–dielectric films using two different characterization techniques based on nonparametric and multiple oscillator models. We consider four series of thin metal–dielectric films produced under various deposition conditions with different optical properties. We compare characterization results obtained by nonparametric and multiple oscillator techniques and demonstrate that the results are consistent. The consistency of the results proves their reliability.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Hrvoje Zorc, )

Ustanove
Institut "Ruđer Bošković", Zagreb

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • SCI-EXP, SSCI i/ili A&HCI
  • MEDLINE


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