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Pregled bibliografske jedinice broj: 539493

Micro and nano structure of electrochemically etched silicon epitaxial wafers


Gamulin, Ozren; Balarin, Maja; Ivanda, Mile; Kosović, Marin; Đerek, Vedran; Mikac, Lara; Serec, Kristina; Furić, Krešimir; Krilov, Dubravka
Micro and nano structure of electrochemically etched silicon epitaxial wafers // Proceedings of MIPRO 2011 / Biljanović, Petar ; Skala, Karolj (ur.).
Rijaka: Croatian Society for Information and Communication Technology, Electronics and Microelectronics - MIPRO, 2011. str. 53-54 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


Naslov
Micro and nano structure of electrochemically etched silicon epitaxial wafers

Autori
Gamulin, Ozren ; Balarin, Maja ; Ivanda, Mile ; Kosović, Marin ; Đerek, Vedran ; Mikac, Lara ; Serec, Kristina ; Furić, Krešimir ; Krilov, Dubravka

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of MIPRO 2011 / Biljanović, Petar ; Skala, Karolj - Rijaka : Croatian Society for Information and Communication Technology, Electronics and Microelectronics - MIPRO, 2011, 53-54

ISBN
987-953-233-060-1

Skup
MIPRO 2011, 34th International Convention, MEET Conference

Mjesto i datum
Opatija, Hrvatska, 23-27.05.2011

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Porous silicon; Eitaxial wafers; Raman spectroscopy

Sažetak
Silicon epitaxial wafers consisting of 280 um thick n-type substrate layer and 4-5 um thick epitaxial layer were electrochemically etched in hydrofluoric acid ethanol solution to produce porous silicon samples. The resistivity of substrate was 0.015 ohm cm, while the resistivity of epitaxial layer was 1 ohm cm. By varying the etching time, the different structures were obtained within the epitaxial layer, and on the substrate surface. Due to the lateral etching the epitaxial layer was partially detached from the substrate and could be peeled off. The influence of etching time duration on the structural properties of porous samples was investigated by Raman spectroscopy. The samples were analysed immediately after the etching and six month later while being stored in ambient air. The Raman spectra showed the shift in position of transversal optical (TO) phonon bands between freshly etched samples and the one stored in ambient air.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekt / tema
098-0982904-2898 - Fizika i primjena nanostruktura i volumne tvari (Mile Ivanda, )
108-1080134-3105 - Mehanizmi narušavanja strukture lipoproteina djelovanjem vanjskih čimbenika (Ozren Gamulin, )

Ustanove
Institut "Ruđer Bošković", Zagreb,
Medicinski fakultet, Zagreb