Pregled bibliografske jedinice broj: 538794
Optical characterization and reverse engineering based on multiangle spectroscopy
Optical characterization and reverse engineering based on multiangle spectroscopy // Applied optics, 51 (2012), 2; 245-254 doi:10.1364/AO.51.000245 (međunarodna recenzija, članak, znanstveni)
Naslov
Optical characterization and reverse engineering based on multiangle spectroscopy
Autori
Tikhonravov, Alexander ; Amotchkina, Tatiana ; Trubetskov, Michael ; Francis, Robert ; Janicki, Vesna ; Sancho-Parramon, Jordi ; Zorc, Hrvoje ; Pervak, Vladimir
Izvornik
Applied optics (0003-6935) 51
(2012), 2;
245-254
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Multiangle spectroscopy; optical characterization
Sažetak
We perform characterization of thin films and reverse engineering of multilayer coatings on the basis of multiangle spectral photometric data provided by a new advanced spectrophotometer accessory. Experimental samples of single thin films and multilayer coatings are produced by magnetron sputtering and e-beam evaporation. Reflectance and transmittance data at two polarization states are measured at the incidence angles from 7 to 40 degrees. We demonstrate that multiangle reflectance and transmittance data provide reliable characterization and reverse engineering results.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekt / tema
098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Hrvoje Zorc, )
Ustanove
Institut "Ruđer Bošković", Zagreb
Autor s matičnim brojem:
Vesna Janicki, (254943)
Jordi Sancho Parramon, (310502)
Hrvoje Zorc, (119546)
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
- MEDLINE